A new noise parameter measurement method for microwave devices

被引：0
|
作者：
Bareau, P [1 ]
Abdipour, A [1 ]
Pacaud, A [1 ]
机构：
[1] ECOLE SUPER ELECT,SERV RADIOELECT & ELECTRON,F-91192 GIF SUR YVETTE,FRANCE
来源：
JOINT CONFERENCE - 1996: IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE & IMEKO TECHNICAL COMMITTEE 7, CONFERENCE PROCEEDINGS, VOLS I AND II: QUALITY MEASUREMENTS: THE INDISPENSABLE BRIDGE BETWEEN THEORY AND REALITY (NO MEASUREMENTS? NO SCIENCE!) | 1996年
关键词：
D O I：
暂无
中图分类号：
TP18 [人工智能理论];
学科分类号：
081104 ; 0812 ; 0835 ; 1405 ;
摘要：
引用
收藏
页码：1502 / 1505
页数：4
相关论文
共 50 条
  • [31] LNA Noise Parameter Measurement
    Lehmeyer, Bernhard
    Ivrlac, Michel T.
    Nossek, Josef A.
    2015 EUROPEAN CONFERENCE ON CIRCUIT THEORY AND DESIGN (ECCTD), 2015, : 45 - 48
  • [32] Design of V-band Impedance Tuner for Parameter Measurement of Microwave Semiconductor Devices
    Yang, Zhixian
    Sun, Lu
    Li, Zhenxiao
    Chen, Xiaolong
    Xie, Yongqiang
    Liang, Shengli
    2024 INTERNATIONAL CONFERENCE ON MICROWAVE AND MILLIMETER WAVE TECHNOLOGY, ICMMT, 2024,
  • [33] A NEW METHOD OF CALCULATING MICROWAVE NOISE IN ELECTRON STREAMS
    PIERCE, JR
    PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1952, 40 (12): : 1675 - 1680
  • [34] A new effective method removing measurement noise
    Liu, DH
    Sun, XY
    Gao, N
    Sun, HQ
    He, Y
    FIFTH INTERNATIONAL SYMPOSIUM ON INSTRUMENTATION AND CONTROL TECHNOLOGY, 2003, 5253 : 345 - 349
  • [35] A new method for RTS noise of semiconductor devices identification
    Konczakowska, Alicja
    Cichosz, Jacek
    Szewczyk, Arkadiusz
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2008, 57 (06) : 1199 - 1206
  • [36] Optimal Design of Passive Devices for Verifying On-Wafer Noise Parameter Measurement Systems
    Wu, Aihua
    Fu, Xingchang
    Liu, Chen
    Li, Chong
    Wang, Yibang
    Liang, Faguo
    Luan, Peng
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2020, 69 (06) : 2837 - 2844
  • [37] A New Phase Shifter-less Delay Line Method for Phase Noise Measurement of Microwave Oscillators
    Gheidi, Hamed
    Banai, Ali
    2008 EUROPEAN MICROWAVE CONFERENCE, VOLS 1-3, 2008, : 1305 - 1308
  • [38] A New Noise Parameter Measurement Method Results in More than 100x Speed Improvement and Enhanced Measurement Accuracy
    Simpson, Gary
    Ballo, David
    Dunsmore, Joel
    Ganwani, Amar
    72ND ARFTG MICROWAVE MEASUREMENT SYMPOSIUM: TIME DOMAIN AND FREQUENCY DOMAIN MEASUREMENT, 2008, : 123 - +
  • [39] MEASUREMENT OF NOISE IN MICROWAVE TRANSMITTERS
    ASHLEY, JR
    BARLEY, TA
    RAST, GJ
    IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1977, 25 (04) : 294 - 318
  • [40] NOISE CALCULATIONS FOR COOLED MICROWAVE DEVICES
    ALBATS, MY
    TELECOMMUNICATIONS AND RADIO ENGINEER-USSR, 1969, (07): : 136 - &
12345