Charge flipping combined with histogram matching to solve complex crystal structures from powder diffraction data

被引:125
作者
Baerlocher, Christian
McCusker, Lynne B. [1 ]
Palatinus, Lukas
机构
[1] ETH, Crystallog Lab, CH-8093 Zurich, Switzerland
[2] Ecole Polytech Fed Lausanne, Crystallog Lab, CH-1015 Lausanne, Switzerland
[3] Acad Sci Czech Republ, Inst Phys, Prague 18221, Czech Republic
来源
ZEITSCHRIFT FUR KRISTALLOGRAPHIE | 2007年 / 222卷 / 02期
关键词
charge flipping; histogram-matching; polycrystalline materials; powder diffraction structure analysis;
D O I
10.1524/zkri.2007.222.2.47
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
The charge-flipping structure-solution algorithm introduced by Oszlanyi and Suto in 2004 has been adapted to accommodate powder diffraction data. In particular, a routine for repartitioning the intensities of overlapping reflections has been implemented within the iterative procedure. This is done by modifiying the electron density map with a histogram-matching algorithm, and then using the Fourier coefficients obtained from this map to repartition the structure factor amplitudes within each overlap group. The effectiveness of the algorithm has been demonstrated with five test examples covering different classes of materials of varying complexity (ZSM-5 ([Si96O192]), cimetidine (C10H16N6S), a polysalicylide ((C7O2H)(6)), the low-temperature modification of 4-methylpyfidine-N-oxide (C6H7NO) with 8 molecules in the asymmetric unit, and a zirconium phosphate phase (vertical bar(C5H6N)(4) (H2O)(2)vertical bar [Zr12P16O60(OH)(4)F-8])). It was also used to solve the structure of a layer silicate (I(CH3)(4)N)(8) (H2O)(20)vertical bar [Si-24 O-56]), whose space group was unclear. These structures, with 17-64 non-H atoms in the asymmetric unit (68-288 in the unit cell), could all be solved in a straightforward manner. Histogram matching proved to be an essential component of the algorithm for the more complex structures. The clear advantages of the charge-flipping algorithm are that (1) all calculations are performed in P1, so space group ambiguities, which are common with powder diffraction data, are irrelevant, (2) no chemical information such as bond distances, bond angles, or connectivity are required, so there is no danger of making incorrect assumptions about the structure, (3) it is equally effective for both organic and inorganic structures, and (4) it is fast, requiring only seconds to minutes per run.
引用
收藏
页码:47 / 53
页数:7
相关论文
共 22 条
  • [1] EXPO:: a program for full powder pattern decomposition and crystal structure solution
    Altomare, A
    Burla, MC
    Camalli, M
    Carrozzini, B
    Cascarano, GL
    Giacovazzo, C
    Guagliardi, A
    Moliterni, AGG
    Polidori, G
    Rizzi, R
    [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1999, 32 : 339 - 340
  • [2] Exploiting texture to estimate the relative intensities of overlapping reflections
    Baerlocher, C
    McCusker, LB
    Prokic, S
    Wessels, T
    [J]. ZEITSCHRIFT FUR KRISTALLOGRAPHIE, 2004, 219 (12): : 803 - 812
  • [3] Structure determination from powder diffraction data
    Baerlocher, C
    McCusker, L
    [J]. ZEITSCHRIFT FUR KRISTALLOGRAPHIE, 2004, 219 (12): : 782 - 782
  • [4] BAERLOCHER C, 1990, FORTRAN PROGRAM EXTR
  • [5] Baerlocher Ch., 1982, XRS 82 XRAY RIETVELD
  • [6] THE STRUCTURE OF CIMETIDINE (C10H16N6S) SOLVED FROM SYNCHROTRON-RADIATION X-RAY-POWDER DIFFRACTION DATA
    CERNIK, RJ
    CHEETHAM, AK
    PROUT, CK
    WATKIN, DJ
    WILKINSON, AP
    WILLIS, BTM
    [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1991, 24 : 222 - 226
  • [7] Synchrotron and neutron diffraction study of 4-methylpyridine-N-oxide at low temperature
    Damay, Francoise
    Carretero-Genevrier, Adrian
    Cousson, Alain
    Van Beek, Wouter
    Rodriguez-Carvajal, Juan
    Fillaux, Francois
    [J]. ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE, 2006, 62 : 627 - 633
  • [8] David W. I. F., 2002, STRUCTURE DETERMINAT
  • [9] DONG J, UNPUB MICROPOROUS ME
  • [10] IMPROVED TREATMENT OF SEVERELY OR EXACTLY OVERLAPPING BRAGG-REFLECTIONS FOR THE APPLICATION OF DIRECT-METHODS TO POWDER DATA
    ESTERMANN, MA
    GRAMLICH, V
    [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1993, 26 : 396 - 404