Reliability evaluation for Blu-Ray laser diodes

被引：7

作者：

Meneghini, Matteo ^{[1
]}

Trivellin, Nicola ^{[1
]}

Orita, Kenji ^{[2
]}

Yuri, Masaaki ^{[2
]}

Tanaka, Tsuyoshi ^{[2
]}

Ueda, Daisuke ^{[2
]}

Zanoni, Enrico ^{[1
]}

Meneghesso, Gaudenzio ^{[1
]}

机构：

[1] Univ Padua, Dept Informat Engn, I-35131 Padua, Italy

[2] Panasonic Corp, Osaka 5691193, Japan

来源：

MICROELECTRONICS RELIABILITY | 2010年 / 50卷 / 04期

关键词：

DEGRADATION;

D O I：

10.1016/j.microrel.2010.01.034

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

With this paper we describe an extensive analysis of the reliability of InGaN-based laser diodes, emitting at 405 nm. These devices have excellent characteristics for application in the next-generation optical data storage systems. The analysis aims at describing the degradation process, as well as at investigating the role of current in determining the degradation rate. The results obtained within this paper suggest that the degradation of the laser diodes is correlated to the increase in the non-radiative recombination rate, with subsequent worsening of the optical properties of the devices. Furthermore, our findings support the hypothesis that current is the main driving force for degradation, while temperature and optical power play only a limited role in determining the degradation kinetics. (C) 2010 Published by Elsevier Ltd.

引用

页码：467 / 470

页数：4

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