Impact of radiation-induced defects on the yellow luminescence band in MOCVD GaN

被引:18
作者
Emtsev, VV [1 ]
Davydov, VY
Goncharuk, IN
Kalinina, EV
Kozlovskii, VV
Poloskin, DS
Sakharov, AV
Shmidt, NM
Smirnov, AN
Usikov, AS
机构
[1] Russian Acad Sci, Ioffe Physicotech Inst, St Petersburg 194021, Russia
[2] State Tech Univ, St Petersburg 195251, Russia
来源
DEFECTS IN SEMICONDUCTORS - ICDS-19, PTS 1-3 | 1997年 / 258-2卷
关键词
gallium nitride; irradiation; native defects; luminescence;
D O I
10.4028/www.scientific.net/MSF.258-263.1143
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Changes in a yellow luminescence band at similar to 2.2 eV were studied for n- and p-GaN subjected to electron and gamma-irradiation at room temperature. The intensity of the band strongly increases upon irradiation. Pronounced shifts of the band after irradiation is also observed. The experimental results obtained allow us to conclude that the gallium vacancy is involved in the yellow luminescence, in accordance with the recent theoretical predictions. It has been suggested that there is also another component in the luminescence band due to unidentified grown-in defects. Irradiation gives rise to strong changes in concentrations of charge carriers in n- and p-GaN.
引用
收藏
页码:1143 / 1148
页数:6
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