Improving on-line BIST-based diagnosis for roving STARs

被引：14
作者：
Abramovici, M [1 ]
Stroud, C [1 ]
Skaggs, B [1 ]
Emmert, J [1 ]
机构：
[1] Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA
来源：
6TH IEEE INTERNATIONAL ON-LINE TESTING WORKSHOP, PROCEEDINGS | 2000年
关键词：
D O I：
10.1109/OLT.2000.856608
中图分类号：
TP39 [计算机的应用];
学科分类号：
081203 ; 0835 ;
摘要：
We present improvements to our on-line BIST-based diagnosis technique originally used in the roving STARs approach[1]. The enhanced technique starts with a new method of analyzing the BIST results, and employs the original divide-and-conquer method as a second phase only when the first phase fails or it does not achieve maximum diagnostic resolution. The combined technique significantly reduces the diagnosis time, improves the resolution in several cases, and also requires less fault-free resources.(1).
引用
收藏
页码：31 / 39
页数：9
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