Time-resolved simultaneous detection of structural and chemical changes during self-assembly of mesostructured films

被引：49
作者：
Innocenzi, Plinio
Malfatti, Luca
Kidchob, Tongjit
Costacurta, Stefano
Falcaro, Paolo
Piccinini, Massimo
Marcelli, Augusto
Morini, Pierangelo
Sali, Diego
Amenitsch, Heinz
机构：
[1] Univ Sassari, Lab Sci Mat & Nanotecnol, Dipartimento Architettura & Pianificaz, Nanoworld Inst, I-07041 Alghero, Sassari, Italy
[2] INSTM, I-07041 Alghero, Sassari, Italy
[3] Dipartimento Ingn Meccan, Settore Mat, I-35131 Padua, Italy
[4] Assoc CIVEN Nano Fabricat Facil, I-30175 Venice, Italy
[5] Ist Nazl Fis Nucl, Lab Nazl Frascati, I-00044 Frascati, Italy
[6] Univ Rome Tre, Dipartimento Sci Geol, I-00146 Rome, Italy
[7] Bruker Opt Srl, I-20133 Milan, Italy
[8] Austrian Acad Sci, Inst Biophys & Xray Struct Res, A-8042 Graz, Austria
来源：
JOURNAL OF PHYSICAL CHEMISTRY C | 2007年 / 111卷 / 14期
关键词：
D O I：
10.1021/jp066566c
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
In situ and time-resolved simultaneous analysis by two different and complementary techniques, Fourier transform infrared spectroscopy (FTIR) and small-angle X-ray scattering (SAXS), has been developed. A conventional source for the infrared light and synchrotron radiation for the X-ray beam have been used. The new technique has been applied to the study of self-assembling mesostructured films during dip-coating. The combined FTIR and SAXS analytical approach has given the possibility of getting a direct correlation between the chemical processes and the structural changes occurring in the film during the deposition.
引用
收藏
页码：5345 / 5350
页数：6
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