Whole-field optical strain sensor using a microlens array

被引:9
作者
Asundi, Anand K. [1 ]
Wang, Jun
Priyadarshi, A.
Zhou, Wei
Mhaisalkar, S.
Lim, Lennie E. N.
机构
[1] Nanyang Technol Univ, Sch Mech & Aerosp Engn, Singapore 639798, Singapore
[2] Nanyang Technol Univ, Sch Mat Sci & Engn, Singapore 639798, Singapore
关键词
strain measurement; Shack-Hartmann (SH) wavefront sensor; diffraction grating;
D O I
10.1117/1.2716372
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We discuss a novel whole-field optical strain sensor termed the moire interferometric strain sensor (MISS) for simultaneous measuring of multipoint strains and whole-field contours of in-plane displacement. A high-frequency grating, attached to the surface of a specimen, is used as the displacement and strain-sensing unit. When illuminated by two collimated beams at a prescribed angle, the interference of the diffracted beams gives the whole-field deformation contours. If, on the other hand, each of the individual beams is separately imaged using a multilens CCD sensor similar to a wavefront sensor, the separation between the spot centroids for each microlens is directly proportional to the normal or shear strain component at the corresponding position on the specimen. Applications are demonstrated for uniform rotation and simulated in-plane strains. (C) 2007 Society of Photo-Optical Instrumentation Engineers.
引用
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页数:5
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