Precise pulse width measurement in write pre-compensation test

被引:0
作者
Okawara, H [1 ]
机构
[1] Agilent Technol Int Japan Ltd, Tokyo, Japan
来源
INTERNATIONAL TEST CONFERENCE 2004, PROCEEDINGS | 2004年
关键词
D O I
暂无
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Bit density on platters in hard disk drives gets so crowded that the signal stream read out of the magnetic media involves inter-symbol interference. In order to reduce the effect write data timing is tweaked according to specific bit patterns. This "write pre-compensation" is a tiny pulse width modification. Device manufacturers test this functionality by generating a special clock stream whose pulse width is very narrow. Time interval analyzers (TIA) can measure this pulse width precisely. However, the drawback of this is the requirement of a wide analog bandwidth and the need to compensate for a DC signal offset. Compared to a TIA approach, the use of a waveform sampler is shown to be simple, less costly and provides an appropriate capability. This article describes that phase increments of the fundamental frequency component can indicate pulse width increments. A data processing based on fast Fourier transform is described DC shift has no influence in this method. A measurement instrument does not need a wide analog bandwidth.
引用
收藏
页码:972 / 979
页数:8
相关论文
共 5 条
  • [1] ASHAR KG, 1997, MAGNETIC DISK DRIVE, P200
  • [2] MAHONEY M, 1987, DSP BASED TESTING AN, P43
  • [3] OHISHI S, 1989, FOURIER ANAL, P56
  • [4] Okawara H, 2002, INT TEST CONF P, P110
  • [5] PHILLIPS CL, 2000, SIGNALS SYSTEMS TRAN, P209