2D layered SiP as anisotropic nonlinear optical material

被引：29

作者：

Sar, Huseyin ^{[1
]}

Gao, Jie ^{[1
]}

Yang, Xiaodong ^{[1
]}

机构：

[1] Missouri Univ Sci & Technol, Dept Mech & Aerosp Engn, Rolla, MO 65409 USA

来源：

SCIENTIFIC REPORTS | 2021年 / 11卷 / 01期

基金：

美国国家科学基金会;

关键词：

HIGHLY SENSITIVE DETECTION; 3RD-HARMONIC GENERATION; SEMICONDUCTORS; STABILITY; SILICON;

D O I：

10.1038/s41598-021-85938-4

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

Two-dimensional (2D) material of silicon phosphide (SiP) has recently been shown as a promising optical material with large band gap, fast photoresponse and strong anisotropy. However, the nonlinear optical properties of 2D SiP have not been investigated yet. Here, the thickness-dependent in-plane anisotropic third-harmonic generation (THG) from the mechanically exfoliated 2D layered SiP flakes is reported. The crystal orientation of the SiP flake is determined by the angle-resolved polarized Raman spectroscopy. The angular dependence of the THG emission with respect to the incident linear polarization is found to be strongly anisotropic with the two-fold polarization dependence pattern. Furthermore, the effect of the SiP flake thickness on the THG power is analyzed.

引用

页数：8

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