Measurement of crosstalk-induced delay errors in integrated circuits

被引：1

作者：

Moll, F

Roca, M

Rubio, A

机构：

[1] Univ Politecn Catalunya, Dept Elect Engn, ES-08034 Barcelona, Spain

[2] Univ Illes Balears, Dept Phys, Palma de Mallorca 07071, Spain

来源：

ELECTRONICS LETTERS | 1997年 / 33卷 / 19期

关键词：

VLSI; delays;

D O I：

10.1049/el:19971083

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Coupling between lines may cause a variation in the effective transition delay in a digital signal path if there exists a simultaneous transition in the coupled lines. The authors present a measurement method for this effect, using a specifically designed integrated circuit. It is shown that the effect may produce either an increase or a decrease in the critical path, therefore altering the maximum frequency specification of a synchronous sequential circuit.

引用

页码：1623 / 1624

页数：2