Investigation on Dielectric Material Selection for RF-MEMS Shunt Capacitive Switches Using Ashby, TOPSIS and VIKOR

被引:10
|
作者
Patra, Pritam [1 ]
Angira, Mahesh [2 ]
机构
[1] BITS, Dept Elect & Elect Engn, Pilani, Rajasthan, India
[2] NIT, Elect & Commun Engn Dept, Hamirpur, HP, India
关键词
Ashby method; Capacitive switches; Dielectric; RF-MEMS; TOPSIS; VIKOR;
D O I
10.1007/s42341-019-00162-2
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this paper, different material selection techniques like Ashby, TOPSIS and VIKOR have been used to select the best dielectric material for RF-MEMS switches with low power consumption. These methods help in choosing the optimum material from the available pool of materials. The dielectric material should be selected such that RF-MEMS capacitive switch should have good RF response, high thermal conductivity, low thermal coefficient of expansion, and low leakage current. For this purpose, the concerned material indices should have high value of relative permittivity, high value of electrical resistivity, low value of thermal coefficient of expansion, and high value of thermal conductivity. The presence of trade-offs led to no conclusive selection in case of Ashby's method. Following Ashby's method, TOPSIS and VIKOR method were used to select the optimum material. The end results suggest that TiO2 is the most suitable materials for shunt capacitive RF-MEMS switches.
引用
收藏
页码:157 / 164
页数:8
相关论文
共 50 条
  • [21] Investigation of Charging Mechanisms in RF-MEMS Capacitive Switches with Silicon Nitride: The Effect of Material Stoichiometry
    Papaioannou, G.
    Tavassolian, N.
    Koutsoureli, M.
    Papandreou, E.
    Papapolymerou, J.
    2009 IEEE/MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM, VOLS 1-3, 2009, : 1653 - +
  • [22] Kelvin probe microscopy for reliability investigation of RF-MEMS capacitive switches
    Belarni, A.
    Lamhamdi, M.
    Pons, P.
    Boudou, L.
    Guastavino, J.
    Segui, Y.
    Papaioannou, G.
    Plana, R.
    MICROELECTRONICS RELIABILITY, 2008, 48 (8-9) : 1232 - 1236
  • [23] MATERIAL SELECTION OF RF-MEMS SWITCH USED FOR RECONFIGURABLE ANTENNA USING ASHBY'S METHODOLOGY
    Sharma, A. K.
    Gupta, N.
    PROGRESS IN ELECTROMAGNETICS RESEARCH LETTERS, 2012, 31 : 147 - 157
  • [24] Mixed-domain simulation of intermodulation distortion in RF-MEMS capacitive shunt switches
    Gaddi, R
    Iannacci, J
    Gnudi, A
    33RD EUROPEAN MICROWAVE CONFERENCE, VOLS 1-3, CONFERENCE PROCEEDINGS, 2003, : 671 - 674
  • [25] A Novel RF-MEMS Shunt Capacitive Switch Design for Dielectric Charging Mitigation
    Liu, Yuhao
    Bi, Songjie
    Bey, Yusha
    Liu, Xiaoguang
    2015 IEEE MTT-S INTERNATIONAL MICROWAVE WORKSHOP SERIES ON ADVANCED MATERIALS AND PROCESSES FOR RF AND THZ APPLICATIONS (IMWS-AMP), 2015, : 174 - 176
  • [26] Effects of atmosphere on the reliability of RF-MEMS capacitive switches
    Blondy, Pierre
    Crunteanu, Aurelian
    Pothier, Arnaud
    Tristant, Pascal
    Catherinot, Alain
    Champeaux, Corinne
    2007 EUROPEAN MICROWAVE CONFERENCE, VOLS 1-4, 2007, : 1346 - 1348
  • [27] Effects of atmosphere on the reliability of RF-MEMS capacitive switches
    Blondy, Pierre
    Crunteanu, Aurelian
    Pothier, Arnaud
    Tristant, Pascal
    Catherinot, Alain
    Champeaux, Corinne
    2007 EUROPEAN MICROWAVE INTEGRATED CIRCUITS CONFERENCE, VOLS 1 AND 2, 2007, : 363 - 365
  • [28] RF-MEMS switches with AlN dielectric and their applications
    Badia, Montserrat Fernandez-Bolanos
    Nicole, Pierre
    Ionescu, Adrian Mihai
    INTERNATIONAL JOURNAL OF MICROWAVE AND WIRELESS TECHNOLOGIES, 2011, 3 (05) : 509 - 520
  • [29] Designs and analysis of series capacitive RF-MEMS switches
    Sun, J. (jhsun2008@yahoo.com.cn), 2005, Science Press (26):
  • [30] THE IMPACT OF DIELECTRIC MATERIAL AND TEMPERATURE ON DIELECTRIC CHARGING IN RF MEMS CAPACITIVE SWITCHES
    Papaioannou, George
    ADVANCED MATERIALS AND TECHNOLOGIES FOR MICRO/NANO-DEVICES, SENSORS AND ACTUATORS, 2010, : 141 - 153