An analog mixed-signal test controller

被引：0

作者：

AbedEl-Halin, MA ^{[1
]}

机构：

[1] Mentor Consulting, Mentor Graph Egypt, Cairo 11341, Egypt

来源：

2002 45TH MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOL I, CONFERENCE PROCEEDINGS | 2002年

关键词：

D O I：

暂无

中图分类号：

TP18 [人工智能理论];

学科分类号：

081104 ; 0812 ; 0835 ; 1405 ;

摘要：

A design for test (DFT) technique for analog mixed-signal (AMS) system-on-a-chip (SoC) is presented; both methodology and implementation are introduced. Using the IEEE boundary scan standard 1149.4, small embedded analog test controller (ATC), and utilizes the embedded SoC memory(1). Using this structure almost any AMS-SoC can be tested for both manufacturing and on-line tests. This technique relaxes the tester requirements and enables cost effective on-line testing.

引用

页码：384 / 387

页数：4

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