An analog mixed-signal test controller

被引：0

作者：

AbedEl-Halin, MA ^{[1
]}

机构：

[1] Mentor Consulting, Mentor Graph Egypt, Cairo 11341, Egypt

来源：

2002 45TH MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOL I, CONFERENCE PROCEEDINGS | 2002年

关键词：

D O I：

暂无

中图分类号：

TP18 [人工智能理论];

学科分类号：

081104 ; 0812 ; 0835 ; 1405 ;

摘要：

A design for test (DFT) technique for analog mixed-signal (AMS) system-on-a-chip (SoC) is presented; both methodology and implementation are introduced. Using the IEEE boundary scan standard 1149.4, small embedded analog test controller (ATC), and utilizes the embedded SoC memory(1). Using this structure almost any AMS-SoC can be tested for both manufacturing and on-line tests. This technique relaxes the tester requirements and enables cost effective on-line testing.

引用

页码：384 / 387

页数：4

共 50 条

[21] Oscillation-test strategy for analog and mixed-signal integrated circuits
Arabi, K
Kaminska, B
14TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 1996, : 476 - 482
[22] Analog and mixed-signal extensions to VHDL
Vachoux, A
ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING, 1998, 16 (02) : 185 - 200
[23] Test infrastructure design for mixed-signal SOCs with wrapped analog cores
Sehgal, A
Ozev, S
Chakrabarty, K
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2006, 14 (03) : 292 - 304
[24] Analog and Mixed-Signal Extensions to VHDL
Alain Vachoux
Analog Integrated Circuits and Signal Processing, 1998, 16 : 185 - 200
[25] THOUGHTS ON ANALOG AND MIXED-SIGNAL MODELS
WONG, J
ELECTRONIC DESIGN, 1992, 40 (23) : 48 - 48
[26] ANALOG AND MIXED-SIGNAL IC DESIGN
MASSARA, R
STEPTOE, K
IEE REVIEW, 1992, 38 (02): : 75 - 79
[27] Analog- and Mixed-Signal Fabrics
Kemerling, James C.
Greenwell, Robert
Bharath, Bhaskar
PROCEEDINGS OF THE IEEE, 2015, 103 (07) : 1087 - 1101
[28] A parametric test method for analog components in integrated mixed-signal circuits
Pronath, M
Gloeckel, V
Graeb, H
ICCAD - 2000 : IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER AIDED DESIGN, 2000, : 557 - 561
[29] Practical Simulation Flow for Evaluating Analog/Mixed-Signal Test Techniques
Barragan, Manuel J.
Stratigopoulos, Haralampos-G.
Mir, Salvador
Le-Gall, Herve
Bhargava, Neha
Bal, Ankur
IEEE DESIGN & TEST, 2016, 33 (06) : 46 - 54
[30] Built-in self-test for analog and mixed-signal designs
Cheng, KT
PROCEEDINGS OF THE FIFTH ASIAN TEST SYMPOSIUM (ATS '96), 1996, : 197 - 197

← 1 2 3 4 5 →