Particle measurement gets smarter

被引：0
作者：
Poliski, I
机构：
来源：
R&D MAGAZINE | 2002年 / 44卷 / 12期
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D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Even established techniques in the particle measurement arena have undergone improvements, both in software and in electronics used for data analysis. One reason is that more detailed information is required than previously. Some companies are merging multiple techniques into single instruments. And finally, the pharmaceutical industry is asking that technology be incorporated into instruments to provide traceability.
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页码：50 / 54
页数：5
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