MCX: a Synchrotron Radiation Beamline for X-ray Diffraction Line Profile Analysis

被引：113

作者：

Rebuffi, Luca ^{[1
,2
]}

Plaisier, Jasper R. ^{[1
]}

Abdellatief, Mahmoud ^{[1
]}

Lausi, Andrea ^{[1
]}

Scardi, Paolo ^{[2
]}

机构：

[1] Elettra Sincrotrone Trieste SCpA, I-34149 Trieste, Italy

[2] Univ Trento, Dept Civil Environm & Mech Engn, I-38123 Trento, Italy

来源：

ZEITSCHRIFT FUR ANORGANISCHE UND ALLGEMEINE CHEMIE | 2014年 / 640卷 / 15期

关键词：

Synchrotron radiation; X-ray diffraction; Line Profile Analysis; Nanomaterials; Instrumental profile function; POWDER DIFFRACTOMETER; AXIAL DIVERGENCE; LATTICE-DEFECTS; BEHAVIOR; DEFORMATION;

D O I：

10.1002/zaac.201400163

中图分类号：

O61 [无机化学];

学科分类号：

070301 ; 081704 ;

摘要：

The potential of modern methods for X-ray diffraction Line Profile Analysis can be fully exploited with data collected at synchrotron radiation beamlines, provided that optics and experimental set-up are suitably designed and characterized. The Material Characterization by X-ray Diffraction beamline, MCX, at Elettra-Sincrotrone Trieste, may operate with a set-up optimally arranged to study nanostructured materials, investigating details of crystalline domain size and shape, lattice defects, and local atomic displacement of static and dynamic nature. Main features of MCX are briefly discussed and best operating conditions illustrated by representative case studies.

引用

页码：3100 / 3106

页数：7

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