Simple high resolution nanoimprint-lithography

被引:21
作者
Haeffner, M. [1 ]
Heeren, A.
Fleischer, M.
Kern, D. P.
Schmidt, G.
Molenkamp, L. W.
机构
[1] Univ Tubingen, Inst Angew Phys, D-72076 Tubingen, Germany
[2] Univ Wurzburg, Inst Phys, D-97074 Wurzburg, Germany
关键词
high resolution; nanoimprint lithography; hydrogen silsesquioxane;
D O I
10.1016/j.mee.2007.01.020
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We report an inexpensive and simple way of performing nanoimprint-lithography. For this purpose a stamp is fabricated by using electron beam patterning of hydrogen silsesquioxane (HSQ) on a silicon substrate. The developed HSQ-resist can be used directly as a stamp for nanoimprint-lithography. Thus with a simple imprinting setup and an improved stamp fabrication process high resolution imprints can easily be made. The method reported here differs from previous work in the specific method of baking and developing the HSQ-resist and the imprint process. Reproducible imprints can be obtained by pressing the stamp in a layer of heated PMMA spin-coated on a silicon substrate. (c) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码:937 / 939
页数:3
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