Observation of crystallization process from amorphous Bi4Ti3O12 prepared by rapid quenching method

被引：15

作者：

Takashige, M

Hamazaki, S

Takhashi, Y

Shimizau, F

Yamaguchi, T

Jang, MS

Kojima, S

机构：

[1] Iwaki Meisei Univ, Dept Elect, Iwaki, Fukushima 9708551, Japan

[2] Iwaki Meisei Univ, Dept Elect Engn, Hino, Tokyo 1918506, Japan

[3] Pusan Natl Univ, Res Ctr Dielect & Adv Matter Phys, Pusan 609735, South Korea

[4] Univ Tsukuba, Inst Mat Sci, Tsukuba, Ibaraki 3058573, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 2000年 / 39卷 / 9B期

关键词：

amorphous; rapid quenching; Bi4Ti3O12; crystallization; atomic force microscope; AFM;

D O I：

10.1143/JJAP.39.5716

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We studied the crystallization of amorphous samples of Bi4Ti3O12 prepared by rapid quenching. Differential thermal analysis, powder X-ray diffraction and Raman spectral measurements revealed that the amorphous sample first crystallizes at approximately 610 degreesC to a metastable Bi2Ti2O7 phase and then transforms irreversibly to the stable Bi4Ti3O12 phase at approximately 830 degreesC.

引用

页码：5716 / 5718

页数：3

共 8 条

[1] ANOMALOUS DIELECTRIC BEHAVIOR AND REVERSIBLE PYROELECTRICITY IN ROLLER-QUENCHED LINBO3 AND LITAO3 GLASS [J].

GLASS, AM ;

LINES, ME ;

NASSAU, K ;

SHIEVER, JW .

APPLIED PHYSICS LETTERS, 1977, 31 (04) :249-251

[2] CRYSTALLIZING PROCESS OF AMORPHOUS THICK-FILMS OF FERROELECTRIC LEAD GERMANATE FAMILY [J].

HATANO, J ;

MUKAIGAWA, T ;

UEHARA, H ;

GRUVERMAN, A ;

TAKAHASHI, K ;

YUKINO, K .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1994, 33 (9B) :5521-5524

[3]

Jang MS, 1995, J KOREAN PHYS SOC, V28, pS605

[4] RAMAN-SCATTERING STUDY OF BISMUTH LAYER-STRUCTURE FERROELECTRICS [J].

KOJIMA, S ;

IMAIZUMI, R ;

HAMAZAKI, S ;

TAKASHIGE, M .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1994, 33 (9B) :5559-5564

[5]

Takahashi K., 1985, Japanese Journal of Applied Physics, Supplement, V24, P616

[6] CRYSTALLIZATION PROCESS FROM AMORPHOUS PBTIO3 [J].

TAKASHIGE, M ;

NAKAMURA, T ;

OZAWA, H ;

UNO, R ;

TSUYA, N ;

ARAI, KI .

JAPANESE JOURNAL OF APPLIED PHYSICS, 1980, 19 (05) :L255-L258

[7] Observation of the crystallization process from amorphous PbTiO3 and Pb5Ge3O11 by atomic force microscopy [J].

Takashige, M ;

Hamazaki, S ;

Fukurai, N ;

Tashiro, N ;

Shimizu, F ;

Kojima, T ;

Hatano, J ;

Jang, MS ;

Takahashi, K .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1997, 36 (9B) :6150-6154

[8] Phase and microstructural evolution during the interaction between bismuth oxide films and Pt/Ti/SiO2/Si substrates [J].

Wen, CY ;

Lu, CH .

FERROELECTRICS LETTERS SECTION, 1999, 26 (5-6) :125-135

← 1 →