We report the first self-catalyzed growth of high-quality GaSb nanowires on InAs stems using metal-organic chemical vapor deposition (MOCVD) on Si (111) substrates. To achieve the growth of vertical InAs/GaSb heterostructure nanowires, the two-step flow rates of the trimethylgallium (TMGa) and trimethylantimony (TMSb) are used. We first use relatively low TMGa and TMSb flow rates to preserve the Ga droplets on the thin InAs stems. Then, the flow rates of TMGa and TMSb are increased to enhance the axial growth rate. Because of the slower radial growth rate of GaSb at higher growth temperature, GaSb nanowires grown at 500 degrees C exhibit larger diameters than those grown at 520 degrees C. However, with respect to the axial growth, due to the Gibbs-Thomson effect and the reduction in the droplet supersaturation with increasing growth temperature, GaSb nanowires grown at 500 degrees C are longer than those grown at 520 degrees C. Detailed transmission electron microscopy (TEM) analyses reveal that the GaSb nanowires have a perfect zinc-blende (ZB) crystal structure. The growth method presented here may be suitable for other antimonide nanowire growth, and the axial InAs/GaSb heterostructure nanowires may have strong potential for use in the fabrication of novel nanowire-based devices and in the study of fundamental quantum physics.
机构:
Zhejiang Univ, State Key Lab Silicon Mat, Hangzhou 310027, Peoples R ChinaZhejiang Univ, State Key Lab Silicon Mat, Hangzhou 310027, Peoples R China
Zeng, YJ
Ye, ZZ
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Zhejiang Univ, State Key Lab Silicon Mat, Hangzhou 310027, Peoples R ChinaZhejiang Univ, State Key Lab Silicon Mat, Hangzhou 310027, Peoples R China
Ye, ZZ
Xu, WZ
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Zhejiang Univ, State Key Lab Silicon Mat, Hangzhou 310027, Peoples R ChinaZhejiang Univ, State Key Lab Silicon Mat, Hangzhou 310027, Peoples R China
Xu, WZ
Zhu, LP
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Zhejiang Univ, State Key Lab Silicon Mat, Hangzhou 310027, Peoples R ChinaZhejiang Univ, State Key Lab Silicon Mat, Hangzhou 310027, Peoples R China
Zhu, LP
Zhao, BH
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Zhejiang Univ, State Key Lab Silicon Mat, Hangzhou 310027, Peoples R ChinaZhejiang Univ, State Key Lab Silicon Mat, Hangzhou 310027, Peoples R China
机构:
Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USAAir Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA
Paduano, Qing
Snure, Michael
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Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USAAir Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA
Snure, Michael
Siegel, Gene
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Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA
Wyle Labs Inc, 2601 Mission Point Blvd, Dayton, OH 45431 USAAir Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA
Siegel, Gene
Thomson, Darren
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Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USAAir Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA
Thomson, Darren
Look, David
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Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA
Wyle Labs Inc, 2601 Mission Point Blvd, Dayton, OH 45431 USA
Wright State Univ, Semicond Res Ctr, Dayton, OH 45435 USAAir Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA
机构:
Zhejiang Univ, State Key Lab Silicon Mat, Hangzhou 310027, Peoples R ChinaZhejiang Univ, State Key Lab Silicon Mat, Hangzhou 310027, Peoples R China
Zeng, YJ
Ye, ZZ
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Zhejiang Univ, State Key Lab Silicon Mat, Hangzhou 310027, Peoples R ChinaZhejiang Univ, State Key Lab Silicon Mat, Hangzhou 310027, Peoples R China
Ye, ZZ
Xu, WZ
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Zhejiang Univ, State Key Lab Silicon Mat, Hangzhou 310027, Peoples R ChinaZhejiang Univ, State Key Lab Silicon Mat, Hangzhou 310027, Peoples R China
Xu, WZ
Zhu, LP
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Zhejiang Univ, State Key Lab Silicon Mat, Hangzhou 310027, Peoples R ChinaZhejiang Univ, State Key Lab Silicon Mat, Hangzhou 310027, Peoples R China
Zhu, LP
Zhao, BH
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Zhejiang Univ, State Key Lab Silicon Mat, Hangzhou 310027, Peoples R ChinaZhejiang Univ, State Key Lab Silicon Mat, Hangzhou 310027, Peoples R China
机构:
Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USAAir Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA
Paduano, Qing
Snure, Michael
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机构:
Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USAAir Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA
Snure, Michael
Siegel, Gene
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机构:
Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA
Wyle Labs Inc, 2601 Mission Point Blvd, Dayton, OH 45431 USAAir Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA
Siegel, Gene
Thomson, Darren
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h-index: 0
机构:
Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USAAir Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA
Thomson, Darren
Look, David
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h-index: 0
机构:
Air Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA
Wyle Labs Inc, 2601 Mission Point Blvd, Dayton, OH 45431 USA
Wright State Univ, Semicond Res Ctr, Dayton, OH 45435 USAAir Force Res Lab, Sensors Directorate, Wright Patterson AFB, OH 45433 USA