Structural degradation mechanism of multiwalled carbon nanotubes in electrically treated field emission

被引：22

作者：

Baik, Chan-Wook ^{[1
]}

Lee, Jeonghee ^{[1
]}

Choi, Jun Hee ^{[1
]}

Jung, Insun ^{[1
]}

Choi, Hye Ran ^{[1
]}

Jin, Yong Wan ^{[1
]}

Kim, Jong Min ^{[1
]}

机构：

[1] Samsung Adv Inst Technol, Yongin 446712, South Korea

来源：

APPLIED PHYSICS LETTERS | 2010年 / 96卷 / 02期

关键词：

carbon nanotubes; field emission; Raman spectra; transmission electron microscopy; work function; IN-SITU; TIP;

D O I：

10.1063/1.3291108

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Carbon nanotubes in printed field emission arrays are known to be often damaged during field emission. A high-resolution transmission electron microscopy and Raman scattering spectra suggest that the degraded structure is mainly determined by electrical treatment conditions. A nonstationary alternating-current treatment has caused emitters to be thicker and fewer with loss of crystallinity but improved the emission brightness and uniformity, while a direct-current treatment has shown little influence. The experimental observations can be quantitatively explained by the analytical estimation on the apex radius as well as the work function using the Seppen-Katamuki chart from the Fowler-Nordheim characteristics.

引用

页数：3

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