A case study on radiated emission in a high speed microprocessor based design

被引：0
|
作者：
Meloth, Sandeep [1 ]
机构：
[1] Honeywell Technol Solut, Home & Bldg Technol, Bangalore, Karnataka, India
来源：
2016 14TH INTERNATIONAL CONFERENCE ON ELECTROMAGNETIC INTERFERENCE & COMPATIBILITY (INCEMIC-2016) | 2016年
关键词：
Radiated; Emissions; harmonics;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
One of the challenging aspects in high speed microprocessor based embedded designs is to suppress the source of radiated emission in order to achieve a good EMI/EMC performance. With many high frequency signals running across the board, it is often difficult to identify the source of emission. While we tend to focus on the critical signals, there are chances that interfaces that are not critical to the final product may be contributing to radiated emissions.
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页数：2
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