Thin-film III-V photodetectors integrated on silicon-on-insulator photonic ICs

被引:62
|
作者
Brouckaert, Joost [1 ]
Roelkens, Gunther [1 ]
Van Thourhout, Dries [1 ]
Baets, Roel [1 ]
机构
[1] Univ Ghent, Interuniv Microelect Ctr, Dept Informat Technol, B-9000 Ghent, Belgium
关键词
heterogeneous integration; photonic integrated circuit (IC); silicon-on-insulator (SOI); thin-film photodetectors;
D O I
10.1109/JLT.2007.891172
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We critically assess recent progress in the integration of near-infrared photodetectors onto nanophotonic silicon-on-insulator (SOI) waveguide circuits. Integration of thin-film InGaAs photodetectors is studied in detail. This method consists of bonding unprocessed III-V dies onto the SOI substrate using an intermediate adhesive layer. Both benzocyclobutene and spin-on glass are studied and compared as bonding agents. After the removal of the III-V substrate, the thin-film detectors are fabricated using wafer-scale-compatible processes and lithographically aligned to the underlying SOI waveguides. The process is compatible with the fabrication of InP/InGaAsP laser diodes on SOL A new design of an evanescently coupled metal-semiconductor-metal detector is proposed, proving,the ability to obtain compact and highly efficient integrated InGaAs photodetectors.
引用
收藏
页码:1053 / 1060
页数:8
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