Phase-shifting point-diffraction interferometry with common-path and in-line configuration for microscopy

被引：62

作者：

Gao, Peng ^{[1
,2
,3
,4
]}

Harder, Irina ^{[4
]}

Nercissian, Vanusch ^{[2
]}

Mantel, Klaus ^{[4
]}

Yao, Baoli ^{[1
]}

机构：

[1] Chinese Acad Sci, State Key Lab Transient Opt & Photon, Xian Inst Opt & Precis Mech, Xian 710119, Peoples R China

[2] Univ Erlangen Nurnberg, Inst Opt Informat & Photon, Erlangen, Germany

[3] Chinese Acad Sci, Grad Sch, Beijing 100039, Peoples R China

[4] Max Planck Inst Sci Light, Erlangen, Germany

来源：

OPTICS LETTERS | 2010年 / 35卷 / 05期

基金：

中国国家自然科学基金;

关键词：

D O I：

10.1364/OL.35.000712

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A new common-path and in-line point-diffraction interferometer for quantitative phase microscopy is proposed. The interferometer is constructed by introducing a grating pair into the point-diffraction interferometer, thus forming a common-path and in-line configuration for object and reference waves. Achromatic phase shifting is implemented by linearly moving one of the two gratings in its grating vector direction. The feasibility of the proposed configuration is demonstrated by theoretical analysis and experiments. (C) 2010 Optical Society of America

引用

页码：712 / 714

页数：3

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