Anomalous electronic states in graphite studied by angle-resolved photoemission spectroscopy

被引：1

作者：

Sugawara, K. ^{[1
]}

Sato, T.

Souma, S.

Takahashi, T.

Suematsu, H.

机构：

[1] Tohoku Univ, Dept Phys, Sendai, Miyagi 9808578, Japan

[2] Japan Sci & Technol Agcy, CREST, Kawaguchi 3320012, Japan

[3] Japan Synchrotron Radiat Res Inst, Mikazuki, Hyogo 6795143, Japan

来源：

SCIENCE AND TECHNOLOGY OF ADVANCED MATERIALS | 2006年 / 7卷 / SUPPL. 1期

关键词：

edge-localized state; angle-resolved photoemission spectroscopy; graphite;

D O I：

10.1016/j.stam.2006.04.008

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We report high-resolution angle-resolved photoemission spectroscopy (ARPES) on high quality single crystal of graphite (kish graphite) to elucidate the origin of anomalous physical properties of carbon-based materials. We found an almost flat band in the vicinity of the Fermi level around the K(H) point which is not predicted by the bulk band calculation. We discuss the origin of this anomalous structure in relation to the edge-localized state on the step edges of cleaved surface. (c) 2006 NIMS and Elsevier Ltd. All rights reserved.

引用

页码：S94 / S98

页数：5

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