What defects escape our tests ... and how will we detect them in the future?

被引：0
|
作者：
Nigh, P
机构：
来源：
INTERNATIONAL TEST CONFERENCE 2000, PROCEEDINGS | 2000年
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D O I：
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中图分类号：
TP301 [理论、方法];
学科分类号：
081202 ;
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页码：1123 / 1123
页数：1
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