Temperature-Dependent Properties of Spray-Deposited ITO Thin Films

被引:7
作者
Moholkar, A. V. [1 ,2 ]
Pawar, S. M. [2 ]
Rajpure, K. Y. [3 ]
Patil, P. S. [3 ]
Bhosale, C. H. [3 ]
Kim, J. H. [2 ]
机构
[1] Gopal Krishna Gokhale Coll, Dept Phys, Kolhapur 416012, Maharashtra, India
[2] Chonnam Natl Univ, Dept Mat Sci & Engn, Kwangju 500757, South Korea
[3] Shivaji Univ, Electrochem Mat Lab, Dept Phys, Kolhapur 416004, Maharashtra, India
关键词
atomic force microscopy; oxides; semiconducting materials; x-ray diffraction; INDIUM-TIN-OXIDE; DOPED IN2O3 FILMS; OPTICAL-PROPERTIES; ELECTRICAL-PROPERTIES; OPTOELECTRONIC PROPERTIES; SUBSTRATE-TEMPERATURE; GROWTH; PYROLYSIS; MICROSTRUCTURE; MECHANISM;
D O I
10.1007/s11666-009-9412-4
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Sprayed indium tin oxide (ITO) thin films are synthesized by mixing adequate quantities of ethanolic solutions of indium trichloride and stannic chloride at different substrate temperatures. The pyrolytic decomposition temperature affects the properties and morphology of ITO samples. X-ray diffraction results showed that the films are polycrystalline with cubic structure and exhibit preferential orientation along (222) plane. The SEM and AFM studies indicated that the surface morphology of the samples increases with substrate temperature. The typical I-500 sample is composed of cubic grains and has carrier concentration of 3.26 x 10(20) cm(-3) and mobility of 9.77 cm(2)/V s. The electrical resistivity of ITO films decreased with increasing deposition temperature. The highest figure of merit of film is 4.4 x 10(-3) Omega(-1). Optical absorption studies reveal that films are highly transparent in the visible region and band gap increases with substrate temperature owing to Moss-Burstein effect.
引用
收藏
页码:531 / 540
页数:10
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