共 50 条
- [41] The Study on the Aspect Ratio of Atomic Force Microscope (AFM) Measurements for Triangular Silicon Nanowire 2013 IEEE REGIONAL SYMPOSIUM ON MICRO AND NANOELECTRONICS (RSM 2013), 2013, : 223 - 226
- [42] Study on a measuring method for cutting edges of diamond tools by atomic force microscope(AFM) Yi Qi Yi Biao Xue Bao/Chinese Journal of Scientific Instrument, 2000, 21 (01): : 54 - 57
- [46] ATOMIC FORCE MICROSCOPE INTERNATIONAL JOURNAL OF THE JAPAN SOCIETY FOR PRECISION ENGINEERING, 1991, 25 (04): : 253 - 258