共 50 条
- [3] Imaging the microstructure of copper with the atomic force microscope (AFM) and ultrasonic force microscope (UFM) TESTING, RELIABILITY, AND APPLICATION OF MICRO- AND NANO-MATERIAL SYSTEMS, 2003, 5045 : 122 - 131
- [4] Atomic force microscope combined with scanning tunneling microscope [AFM/STM] Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 1993, 32 (6 B): : 2983 - 2988
- [6] Atomic force microscope (AFM) for semiconductor process evaluation Hitachi Review, 2002, (SPEC):
- [9] ATOMIC-FORCE MICROSCOPE COMBINED WITH SCANNING TUNNELING MICROSCOPE [AFM/STM] JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1993, 32 (6B): : 2983 - 2988