Orientation-dependent phase switching process and strains of Pb0.97La0.02(Zr0.85Sn0.13Ti0.02)O3 antiferroelectric thin films

被引:23
作者
Hao, Xihong [1 ,2 ]
Zhai, Jiwei [1 ]
Shang, Fei [1 ]
Zhou, Jing [3 ]
An, Shengli [2 ]
机构
[1] Tongji Univ, Funct Mat Res Lab, Shanghai 200092, Peoples R China
[2] Inner Mongolia Univ Sci & Technol, Sch Met & Mat, Baotou 014010, Peoples R China
[3] Wuhan Univ Technol, State Key Lab Adv Technol Mat Synth & Proc, Wuhan 430070, Peoples R China
基金
中国国家自然科学基金;
关键词
antiferroelectric materials; lanthanum compounds; lead compounds; magnetic thin films; magnetic transitions; sol-gel processing; SOL-GEL PROCESS; ELECTRICAL-PROPERTIES; DIELECTRIC-PROPERTIES; FIELD; CERAMICS; FATIGUE;
D O I
10.1063/1.3407567
中图分类号
O59 [应用物理学];
学科分类号
摘要
Highly (100) and (111)-oriented Pb0.97La0.02(Zr0.85Sn0.13Ti0.02)O-3 antiferroelectric (AFE) thin films were fabricated through a sol-gel processing. The effects of orientation on phase transformation behaviors and strains of the AFE thin films were studied systemically. As compared to (100)-preferred AFE thin films, the (111)-oriented films showed a smaller forward phase switching field of 250 kV/cm and higher stains of 0.79%. It is therefore concluded that AFE thin films with (111)-preferred orientation are more suitable to be used as microactuators. (c) 2010 American Institute of Physics. [doi:10.1063/1.3407567]
引用
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页数:3
相关论文
共 18 条
[11]   Ferroelectric and antiferroelectric films for microelectromechanical systems applications [J].
Xu, BM ;
Cross, LE ;
Bernstein, JJ .
THIN SOLID FILMS, 2000, 377 :712-718
[12]   Dielectric properties and field-induced phase switching of lead zirconate titanate stannate antiferroelectric thick films on silicon substrates [J].
Xu, BM ;
Ye, YH ;
Cross, LE .
JOURNAL OF APPLIED PHYSICS, 2000, 87 (05) :2507-2515
[13]   Longitudinal and transverse piezoelectric coefficients of lead zirconate titanate/vinylidene fluoride-trifluoroethylene composites with different polarization states [J].
Zeng, R ;
Kwok, KW ;
Chan, HLW ;
Choy, CL .
JOURNAL OF APPLIED PHYSICS, 2002, 92 (05) :2674-2679
[14]   Effect of the orientation on the ferroelectric-antiferroelectric behavior of sol-gel deposited (Pb,Nb)(Zr,Sn,Ti)O3 thin films [J].
Zhai, JW ;
Li, X ;
Chen, HD .
THIN SOLID FILMS, 2004, 446 (02) :200-204
[15]   Electric fatigue in Pb(Nb,Zr,Sn,Ti)O3 thin films grown by a sol-gel process [J].
Zhai, JW ;
Chen, HD .
APPLIED PHYSICS LETTERS, 2003, 83 (05) :978-980
[16]   Direct current field and temperature dependent behaviors of antiferroelectric to ferroelectric switching in highly (100)-oriented PbZrO3 thin films [J].
Zhai, JW ;
Chen, HD .
APPLIED PHYSICS LETTERS, 2003, 82 (16) :2673-2675
[17]   Dielectric properties of oriented PbZrO3 thin films grown by sol-gel process [J].
Zhai, JW ;
Yao, Y ;
Li, X ;
Hung, TF ;
Xu, ZK ;
Chen, H ;
Colla, EV ;
Wu, TB .
JOURNAL OF APPLIED PHYSICS, 2002, 92 (07) :3990-3994
[18]   The impact of government's fundings and tax incentives on industrial R&D investments - Empirical evidences from industrial sectors in Shanghai [J].
Zhu, PF ;
Xu, WM ;
Lundin, N .
CHINA ECONOMIC REVIEW, 2006, 17 (01) :51-69