Temperature response of all-optical XOR logic function based on different semiconductor optical amplifiers

被引:1
作者
Kotb, Amer [1 ,2 ]
Verma, Gopal [1 ]
Li, Wei [1 ]
机构
[1] Chinese Acad Sci, Changchun Inst Opt Fine Mech & Phys, State Key Lab Appl Opt, GPL, Changchun 130033, Peoples R China
[2] Univ Fayoum, Fac Sci, Dept Phys, Al Fayyum, Egypt
关键词
XOR logic gate; operating temperature; semiconductor optical amplifier; quality factor; MACH-ZEHNDER INTERFEROMETER; GATE;
D O I
10.1080/09500340.2022.2090630
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A critical area of research is studying the performance of semiconductor optical amplifiers (SOAs) at high temperatures. In this paper, the performance of all-optical exclusive-OR (XOR) logic gate is investigated at high operating temperatures (T-OP) using different SOAs technologies such as conventional SOAs, carrier reservoir (CR)-SOAs, reflective SOAs (RSOAs), and photonic crystal (PC)-SOAs, for the first time to our knowledge. The time-dependent differential equations of SOAs, CR-SOA, RSOAs, and PC-SOAs at different operating data rates have been solved. The performance of the XOR logic gate is evaluated by calculating the quality factors and plotting the eye diagrams for each amplifier. Besides, the dependence of the key operating parameters on the T-OP is examined and assessed for each scheme. The results showed that the RSOAs perform better at high temperatures than other proposed SOA technologies.
引用
收藏
页码:769 / 778
页数:10
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