Copper Wire Bonding - A Maturing Technology

被引:5
|
作者
Appelt, Bernd K. [1 ]
Tseng, Andy [1 ]
Lai, Yi-Shao [2 ]
Chen, Chun-Hsiung [2 ]
机构
[1] ASE Grp, 3590 Peterson Way, Santa Clara, CA USA
[2] ASE Grp, Kaohsiung, Taiwan
来源
2010 12TH ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE (EPTC) | 2010年
关键词
BALL; AL; GOLD; INTERMETALLICS; RELIABILITY;
D O I
10.1109/EPTC.2010.5702687
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Wire bonding has been the dominant mode of chip to substrate interconnection for many decades. The most common metal used has been gold which is rather malleable and very resistant to oxidation and corrosion. The surge in commodity prices over the last few years has prompted the introduction of copper as a lower cost alternative. While copper has some advantages electrically, thermally and mechanically, it presents also many challenges due to the mechanical properties as well as its propensity for oxidation and corrosion. Here, the successful introduction of fine diameter copper wire bonding into high volume manufacturing is described.
引用
收藏
页码:479 / 483
页数:5
相关论文
共 50 条
  • [21] Performance and Reliability Study of Pd-coated Copper Wire Bonding on ENEPIG Substrate
    Shi, Lulu
    Wang, Qian
    Chen, Yu
    Tan, Lin
    Cai, Jian
    Gu, Xin
    Wang, Shuidi
    Li, Jingwei
    Hu, Yang
    2013 14TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT), 2013, : 1014 - +
  • [22] Study on moisture-induced corrosion mechanism of copper wire bonding by thermodynamic calculation
    Zeng, Yingzhi
    Bai, Kewu
    Jin, Hongmei
    2013 14TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT), 2013, : 777 - 780
  • [23] Application of laser heating and its effects on bonding strengths for varied copper wire purity levels
    Singh, Gurbinder
    Haseeb, A. S. M. A.
    JOURNAL OF LASER APPLICATIONS, 2018, 30 (02)
  • [24] Comparison and mechanism of electromigration reliability between Cu wire and Au wire bonding in molding state
    Du, Yahong
    Gao, Li-Yin
    Yu, Daquan
    Liu, Zhi-Quan
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2020, 31 (04) : 2967 - 2975
  • [25] Parameters Optimization of Copper Wire Bonding on Thin Small Outline Package
    Srikamonsirisak, Sorasit
    Tantinuchawong, Ubonwan
    Satirakul, Yuparwadee
    JOURNAL OF METALS MATERIALS AND MINERALS, 2013, 23 (01): : 13 - 17
  • [26] Void Growth in Thermosonic Copper/Gold Wire Bonding on Aluminum Pads
    Xu, H.
    Acoff, V. L.
    Liu, C.
    Silberschmidt, V. V.
    Chen, Z.
    2011 IEEE 61ST ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC), 2011, : 1729 - 1735
  • [27] Effects of different inhibitor on antioxidation of copper bonding wire at room temperature
    He, Xiaokang
    Guo, Libin
    Gong Gaosen
    Su Fengling
    Zhu, Dachuan
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2022, 33 (13) : 10561 - 10571
  • [28] Characterization of interfacial intermetallic compounds in gold wire bonding with copper pad
    Wang Bisheng
    Lois, Liao Jinzhi
    Li Xiaomin
    2018 IEEE 20TH ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE (EPTC), 2018, : 703 - 707
  • [29] A novel integrated approach to optimize copper wire bonding processes and manufacturing
    Calabretta, Michele
    Sitta, Alessandro
    INTERNATIONAL JOURNAL OF INTERACTIVE DESIGN AND MANUFACTURING - IJIDEM, 2022, 16 (01): : 371 - 379
  • [30] Interfacial Microstructures and Thermodynamics of Thermosonic Cu-Wire Bonding
    Li, Junhui
    Liu, Linggang
    Deng, Luhua
    Ma, Bangke
    Wang, Fuliang
    Han, Lei
    IEEE ELECTRON DEVICE LETTERS, 2011, 32 (10) : 1433 - 1435