Clock grid simulation using transient S-parameter modeling

被引：0

作者：

Kim, Kyung Ki ^{[1
]}

Kim, Yong-Bin ^{[1
]}

Park, N. ^{[2
]}

Lombardi, F. ^{[1
]}

机构：

[1] Northeastern Univ, Dept Elect & Comp Engn, Boston, MA 02115 USA

[2] Oklahoma State Univ, Dept Comp Sci, Stillwater, OK 74078 USA

来源：

2006 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE PROCEEDINGS, VOLS 1-5 | 2006年

关键词：

scattering parameter(S-parameter); clock grid; clock distribution;

D O I：

10.1109/IMTC.2006.328403

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Clock grid networks are now common in most high performance microprocessors. This paper presents a new effective modeling and analyzing methodology for clock grid using scattering parameter. It also describes an efficient approach to find the optimum clock gird specification, such as the width and space of the gird metal line. The interconnection of the clock grid is modeled by RC passive elements. The results show that the error is within 10% comparing to Hspice simulation results.

引用

页码：225 / +

页数：2

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