Transmission Electron Microscopy as Best Technique for Characterization in Nanotechnology

被引：34

作者：

Asadabad, Mohsen Asadi ^{[1
]}

Eskandari, Mohammad Jafari ^{[1
]}

机构：

[1] Nucl Sci & Technol Res Inst, Mat Res Sch, Esfahan, Iran

来源：

SYNTHESIS AND REACTIVITY IN INORGANIC METAL-ORGANIC AND NANO-METAL CHEMISTRY | 2015年 / 45卷 / 03期

关键词：

nanoparticles; characterization; phases; TEM; electron diffraction; NANOPARTICLES;

D O I：

10.1080/15533174.2013.831901

中图分类号：

O61 [无机化学];

学科分类号：

070301 ; 081704 ;

摘要：

The authors summarize the applications of transmission electron microscopy in the field of nanotechnology. Transmission electron microscopy (TEM) has represented as a very powerful instrument for studying and researching about the structure of nanomaterials in the material science world. The quantitative measures of particle size, grain size, size distribution, size homogeneity, lattice type, morphological information, crystallographic details, chemical composition of phases distribution, and parameters can obtain by transmission electron micrographs. So, TEM is the best technique for characterization of the nanomaterials such as nanoparticles and nanocomposites. Moreover, this study shows that electron diffraction pattern via the TEM is a perfect procedure for determining the structure of materials, including perfect crystals, defect structure, and phases. The study tries to show ability of TEM for characterization of nanomaterials.

引用

页码：323 / 326

页数：4

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