Screw misfit dislocations in soft substrates of epitaxial heterostructures

被引:3
作者
Gumen, L
Feldman, E
Yurchenko, V
Krokhin, A
机构
[1] Univ N Texas, Dept Phys, Denton, TX 76203 USA
[2] Univ Popular Autonoma Estado Puebla, Puebla, Mexico
[3] Donetsk Engn Phys Inst, UA-83114 Donetsk, Ukraine
[4] Univ Autonoma Puebla, Inst Fis, Puebla 72570, Mexico
关键词
D O I
10.1080/14786430412331284018
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We derive compact analytical formulae for the elastic field induced by an anti-plane mismatch deformation in a heterostructure with different elastic moduli of the constituents. Unlike previous studies, we consider the possibility that the misfit dislocations may appear in the substrate, not in the epilayer. We show that this situation can be realized in heterostructures where the substrate is softer than the epilayer. In order to avoid cumbersome calculations, we consider screw misfit dislocations. The misfit dislocations emerge with zero density away from the interface in the body of the substrate when the epilayer reaches its critical thickness. Thus the epilayer remains free from dislocations if it is grown on a softer substrate. This property, which was recently observed experimentally, may find numerous applications in electronics, where epilayers are widely used as active elements.
引用
收藏
页码:3427 / 3438
页数:12
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