Focused ion beam milling: A practical method for preparing cast Al-Si alloy samples for transmission electron microscopy

被引：13

作者：

Shankar, S ^{[1
]}

Riddle, YW ^{[1
]}

Makhlouf, MM ^{[1
]}

机构：

[1] Worcester Polytech Inst, Dept Mech Engn, Adv Casting Res Ctr, Worcester, MA 01609 USA

来源：

METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE | 2003年 / 34卷 / 03期

关键词：

D O I：

10.1007/s11661-003-0105-1

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The aluminum-silicon eutectic reaction was of great interest ever since Pacz patented aluminum-silicon alloys in 1921. However, despite the many hypotheses proposed over the past 80 years, the genesis of this technologically important transformation and the crystallographic relations between its constituents remain uncertain. This paper introduces the focused ion beam (FIB) milling technique as a viable method for producing good quality transmission electron microscope (TEM) samples of cast aluminum-silicon alloys.

引用

页码：705 / 707

页数：3

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