Verifying VLSI Circuits

被引：0
作者：
Greenstreet, Mark R. [1 ]
机构：
[1] Univ British Columbia, Dept Comp Sci, Vancouver, BC V6T 1W5, Canada
来源：
AUTOMATED TECHNOLOGY FOR VERIFICATION AND ANALYSIS, PROCEEDINGS | 2009年 / 5799卷
关键词：
ADAPTIVE BODY BIAS; DIE-TO-DIE; FREQUENCY;
D O I：
暂无
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：1 / 20
页数：20
相关论文
共 34 条
[1]   Impact of die-to-die and within-die parameter fluctuations on the maximum clock frequency distribution for gigascale integration [J].
Bowman, KA ;
Duvall, SG ;
Meindl, JD .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2002, 37 (02) :183-190
[2]  
BROCKETT RW, 1989, LECT NOTES CONTR INF, V135, P19
[3]   ANOMALOUS BEHAVIOR OF SYNCHRONIZER AND ARBITER CIRCUITS [J].
CHANEY, TJ ;
MOLNAR, CE .
IEEE TRANSACTIONS ON COMPUTERS, 1973, C 22 (04) :421-422
[4]   Comparison of adaptive body bias (ABB) and adaptive supply voltage (ASV) for improving delay and leakage under the-presence of process variation [J].
Chen, T ;
Naffziger, S .
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2003, 11 (05) :888-899
[5]  
Dastidar TR, 2005, I CONF VLSI DESIGN, P195
[6]  
Franzle M., 2007, J. Satisf. Boolean Model. Comput., V1, P209
[7]  
Frehse G, 2005, LECT NOTES COMPUT SC, V3414, P258
[8]  
Frehse G, 2006, DES AUT TEST EUROPE, P255
[9]  
Greenstreet MR, 1998, LECT NOTES COMPUT SC, V1386, P159
[10]  
GREENSTREET MR, 1997, P 1997 INT S CIRC SY, V2, P977
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