Tensile Test of an Al Nanowire using In-situ Transmission Electron Microscopy and its Dynamic Deformation Behavior

被引：0

作者：

Kim, Sung-Hoon ^{[1
,2
]}

Kim, Hong-Kyu ^{[1
]}

Seo, Jong-Hyun ^{[2
]}

Lee, Jong-Woon ^{[3
]}

Hwang, Dong-Mok ^{[3
]}

Ahn, Jae-Pyoung ^{[2
]}

Lee, Jae-Chul ^{[1
]}

机构：

[1] Korea Univ, Dept Mat Sci & Engn, Seoul 02841, South Korea

[2] Korea Inst Sci & Technol, Adv Anal Ctr, Seoul 02792, South Korea

[3] Sungkyunkwan Univ, School Adv Mat Sci & Engn, Suwon 16419, South Korea

来源：

KOREAN JOURNAL OF METALS AND MATERIALS | 2016年 / 54卷 / 05期

关键词：

nanostructured materials; twinning; nanowires; deformation; transmission electron microscopy (TEM);

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Both the deformation behaviors and the associated structural evolution of an Al nanowire were observed by conducting tensile testing in TEM. The Al nanowire exhibited a strength close to the theoretical value and a substantial elastic limit of similar to 5%. Different from bulk-forms of Al, the Al nanowire did not exhibit any quantifiable plastic strain and failed in a brittle manner. This behavior was related to the formation of deformation twins that interlock. Comparative studies were also performed using an Au nanowire to elucidate the effect that the magnitude of the stacking fault energy (SFE) has on the formation of the deformation twins and plasticity.

引用

页码：386 / 389

页数：4

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