Estimation of circuit output measurements including statistically dependent parameters

被引：4

作者：

Papakostas, DK ^{[1
]}

Hatzopoulos, AA ^{[1
]}

机构：

[1] Aristotle Univ Thessaloniki, Dept Elect & Comp Engn, Thessaloniki 54124, Greece

来源：

INTERNATIONAL JOURNAL OF CIRCUIT THEORY AND APPLICATIONS | 2003年 / 31卷 / 02期

关键词：

analogue circuits; statistical circuit analysis; Monte-Carlo technique;

D O I：

10.1002/cta.218

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

An extension to the method for estimating statistical variables of output measurements, in order to take into account the statistical variations and matching dependencies between circuit parameters, is studied. The enhanced method results in sufficient estimations, while additional circuit simulations are needed. Comparative results from the application of the method and of the Monte-Carlo analysis on three analogue circuits are presented to show the effectiveness of the extended method. Copyright (C) 2003 John Wiley Sons, Ltd.

引用

页码：219 / 228

页数：10

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