Phase-sensitive time-domain terahertz reflectometry

被引：0
|
作者：
Pashkin, A [1 ]
Kadlec, F [1 ]
Nemec, H [1 ]
Kuzel, P [1 ]
机构：
[1] Acad Sci Czech Republ, Inst Phys, Prague 8 18221, Czech Republic
来源：
CONFERENCE DIGEST OF THE 2004 JOINT 29TH INTERNATIONAL CONFERENCE ON INFRARED AND MILLIMETER WAVES AND 12TH INTERNATIONAL CONFERENCE ON TERAHERTZ ELECTRONICS | 2004年
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D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We review a recently developed method for measuring the terahertz reflectivity able to provide correctly both the amplitude and the phase of terahertz radiation reflected from the sample. Thus it is possible to evaluate the complex optical constants of opaque materials including crystals, ceramics and thin films.
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页码：373 / 374
页数：2
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