Cesium control and diagnostics in surface plasma negative ion sources

被引：18
作者：
Dudnikov, Vadim [1 ]
Chapovsky, Pavel [2 ]
Dudnikov, Andrei [3 ]
机构：
[1] Muons Inc, Batavia, IL 60510 USA
[2] Russian Acad Sci, Inst Automat & Electrometry, Novosibirsk 630090, Russia
[3] Budker Inst Nucl Phys, Novosibirsk 630090, Russia
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 2010年 / 81卷 / 02期
关键词：
caesium; discharges (electric); ion sources; ionisation; plasma diagnostics; plasma sources; plasma-beam interactions; two-photon spectra;
D O I：
10.1063/1.3277161
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
For efficient and reliable negative ion generation it is very important to improve a cesium control and diagnostics. Laser beam attenuation and resonance fluorescence can be used for measurement of cesium distribution and cesium control. Resonant laser excitation and two-photon excitation can be used for improved cesium ionization and cesium trapping in the discharge chamber. Simple and inexpensive diode lasers can be used for cesium diagnostics and control. Cesium migration along the surface is an important mechanism of cesium escaping. It is important to develop a suppression of cesium migration and cesium accumulation on the extraction system.
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页数：3
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