共 9 条
Electroluminescence in Si/SiO2 layers
被引:0
作者:

Heikkilä, L
论文数: 0 引用数: 0
h-index: 0
机构:
Turku Univ, Dept Informat Technol, Microelect Lab, FIN-20014 Turku, Finland Turku Univ, Dept Informat Technol, Microelect Lab, FIN-20014 Turku, Finland

Punkkinen, R
论文数: 0 引用数: 0
h-index: 0
机构:
Turku Univ, Dept Informat Technol, Microelect Lab, FIN-20014 Turku, Finland Turku Univ, Dept Informat Technol, Microelect Lab, FIN-20014 Turku, Finland

Hedman, HP
论文数: 0 引用数: 0
h-index: 0
机构:
Turku Univ, Dept Informat Technol, Microelect Lab, FIN-20014 Turku, Finland Turku Univ, Dept Informat Technol, Microelect Lab, FIN-20014 Turku, Finland
机构:
[1] Turku Univ, Dept Informat Technol, Microelect Lab, FIN-20014 Turku, Finland
来源:
TOWARDS THE FIRST SILICON LASER
|
2003年
/
93卷
关键词:
D O I:
暂无
中图分类号:
O43 [光学];
学科分类号:
070207 ;
0803 ;
摘要:
引用
收藏
页码:55 / 60
页数:6
相关论文
共 9 条
[1]
Electroluminescence from Au native silicon oxide layer p+-Si and Au native silicon oxide layer n+-Si structures under reverse biases
[J].
Bai, GF
;
Wang, YQ
;
Ma, ZC
;
Zong, WH
;
Qin, GG
.
JOURNAL OF PHYSICS-CONDENSED MATTER,
1998, 10 (44)
:L717-L721

Bai, GF
论文数: 0 引用数: 0
h-index: 0
机构: Peking Univ, Dept Phys, Beijing 100871, Peoples R China

Wang, YQ
论文数: 0 引用数: 0
h-index: 0
机构: Peking Univ, Dept Phys, Beijing 100871, Peoples R China

Ma, ZC
论文数: 0 引用数: 0
h-index: 0
机构: Peking Univ, Dept Phys, Beijing 100871, Peoples R China

Zong, WH
论文数: 0 引用数: 0
h-index: 0
机构: Peking Univ, Dept Phys, Beijing 100871, Peoples R China

Qin, GG
论文数: 0 引用数: 0
h-index: 0
机构:
Peking Univ, Dept Phys, Beijing 100871, Peoples R China Peking Univ, Dept Phys, Beijing 100871, Peoples R China
[2]
The structural and luminescence properties of porous silicon
[J].
Cullis, AG
;
Canham, LT
;
Calcott, PDJ
.
JOURNAL OF APPLIED PHYSICS,
1997, 82 (03)
:909-965

Cullis, AG
论文数: 0 引用数: 0
h-index: 0
机构:
DEF RES AGCY, MALVERN WR14 3PS, WORCS, ENGLAND DEF RES AGCY, MALVERN WR14 3PS, WORCS, ENGLAND

Canham, LT
论文数: 0 引用数: 0
h-index: 0
机构:
DEF RES AGCY, MALVERN WR14 3PS, WORCS, ENGLAND DEF RES AGCY, MALVERN WR14 3PS, WORCS, ENGLAND

Calcott, PDJ
论文数: 0 引用数: 0
h-index: 0
机构:
DEF RES AGCY, MALVERN WR14 3PS, WORCS, ENGLAND DEF RES AGCY, MALVERN WR14 3PS, WORCS, ENGLAND
[3]
ELECTROLUMINESCENCE STUDIES IN SILICON DIOXIDE FILMS CONTAINING TINY SILICON ISLANDS
[J].
DIMARIA, DJ
;
KIRTLEY, JR
;
PAKULIS, EJ
;
DONG, DW
;
KUAN, TS
;
PESAVENTO, FL
;
THEIS, TN
;
CUTRO, JA
;
BRORSON, SD
.
JOURNAL OF APPLIED PHYSICS,
1984, 56 (02)
:401-416

DIMARIA, DJ
论文数: 0 引用数: 0
h-index: 0
机构:
MIT, CAMBRIDGE, MA 02139 USA MIT, CAMBRIDGE, MA 02139 USA

KIRTLEY, JR
论文数: 0 引用数: 0
h-index: 0
机构:
MIT, CAMBRIDGE, MA 02139 USA MIT, CAMBRIDGE, MA 02139 USA

PAKULIS, EJ
论文数: 0 引用数: 0
h-index: 0
机构:
MIT, CAMBRIDGE, MA 02139 USA MIT, CAMBRIDGE, MA 02139 USA

DONG, DW
论文数: 0 引用数: 0
h-index: 0
机构:
MIT, CAMBRIDGE, MA 02139 USA MIT, CAMBRIDGE, MA 02139 USA

KUAN, TS
论文数: 0 引用数: 0
h-index: 0
机构:
MIT, CAMBRIDGE, MA 02139 USA MIT, CAMBRIDGE, MA 02139 USA

PESAVENTO, FL
论文数: 0 引用数: 0
h-index: 0
机构:
MIT, CAMBRIDGE, MA 02139 USA MIT, CAMBRIDGE, MA 02139 USA

THEIS, TN
论文数: 0 引用数: 0
h-index: 0
机构:
MIT, CAMBRIDGE, MA 02139 USA MIT, CAMBRIDGE, MA 02139 USA

CUTRO, JA
论文数: 0 引用数: 0
h-index: 0
机构:
MIT, CAMBRIDGE, MA 02139 USA MIT, CAMBRIDGE, MA 02139 USA

BRORSON, SD
论文数: 0 引用数: 0
h-index: 0
机构:
MIT, CAMBRIDGE, MA 02139 USA MIT, CAMBRIDGE, MA 02139 USA
[4]
Laser type of spectral narrowing in electroluminescent Si/SiO2 superlattices prepared by low-pressure chemical vapour deposition
[J].
Heikkilä, L
;
Kuusela, T
;
Hedman, HP
.
SUPERLATTICES AND MICROSTRUCTURES,
1999, 26 (03)
:157-169

Heikkilä, L
论文数: 0 引用数: 0
h-index: 0
机构:
Turku Univ, Dept Appl Phys, Lab Elect & Informat Technol, FIN-20014 Turku, Finland Turku Univ, Dept Appl Phys, Lab Elect & Informat Technol, FIN-20014 Turku, Finland

Kuusela, T
论文数: 0 引用数: 0
h-index: 0
机构:
Turku Univ, Dept Appl Phys, Lab Elect & Informat Technol, FIN-20014 Turku, Finland Turku Univ, Dept Appl Phys, Lab Elect & Informat Technol, FIN-20014 Turku, Finland

Hedman, HP
论文数: 0 引用数: 0
h-index: 0
机构:
Turku Univ, Dept Appl Phys, Lab Elect & Informat Technol, FIN-20014 Turku, Finland Turku Univ, Dept Appl Phys, Lab Elect & Informat Technol, FIN-20014 Turku, Finland
[5]
Optical gain in Si/SiO2 lattice:: Experimental evidence with nanosecond pulses
[J].
Khriachtchev, L
;
Räsänen, M
;
Novikov, S
;
Sinkkonen, J
.
APPLIED PHYSICS LETTERS,
2001, 79 (09)
:1249-1251

Khriachtchev, L
论文数: 0 引用数: 0
h-index: 0
机构: Univ Helsinki, Phys Chem Lab, FIN-00014 Helsinki, Finland

Räsänen, M
论文数: 0 引用数: 0
h-index: 0
机构: Univ Helsinki, Phys Chem Lab, FIN-00014 Helsinki, Finland

Novikov, S
论文数: 0 引用数: 0
h-index: 0
机构: Univ Helsinki, Phys Chem Lab, FIN-00014 Helsinki, Finland

Sinkkonen, J
论文数: 0 引用数: 0
h-index: 0
机构: Univ Helsinki, Phys Chem Lab, FIN-00014 Helsinki, Finland
[6]
Observation of laser oscillation in aggregates of ultrasmall silicon nanoparticles
[J].
Nayfeh, MH
;
Rao, S
;
Barry, N
;
Therrien, J
;
Belomoin, G
;
Smith, A
;
Chaieb, S
.
APPLIED PHYSICS LETTERS,
2002, 80 (01)
:121-123

Nayfeh, MH
论文数: 0 引用数: 0
h-index: 0
机构: Univ Illinois, Dept Phys, Urbana, IL 61801 USA

Rao, S
论文数: 0 引用数: 0
h-index: 0
机构: Univ Illinois, Dept Phys, Urbana, IL 61801 USA

Barry, N
论文数: 0 引用数: 0
h-index: 0
机构: Univ Illinois, Dept Phys, Urbana, IL 61801 USA

Therrien, J
论文数: 0 引用数: 0
h-index: 0
机构: Univ Illinois, Dept Phys, Urbana, IL 61801 USA

Belomoin, G
论文数: 0 引用数: 0
h-index: 0
机构: Univ Illinois, Dept Phys, Urbana, IL 61801 USA

Smith, A
论文数: 0 引用数: 0
h-index: 0
机构: Univ Illinois, Dept Phys, Urbana, IL 61801 USA

Chaieb, S
论文数: 0 引用数: 0
h-index: 0
机构: Univ Illinois, Dept Phys, Urbana, IL 61801 USA
[7]
Optical gain in silicon nanocrystals
[J].
Pavesi, L
;
Dal Negro, L
;
Mazzoleni, C
;
Franzò, G
;
Priolo, F
.
NATURE,
2000, 408 (6811)
:440-444

Pavesi, L
论文数: 0 引用数: 0
h-index: 0
机构: Univ Trent, INFM, I-38050 Trento, Italy

Dal Negro, L
论文数: 0 引用数: 0
h-index: 0
机构: Univ Trent, INFM, I-38050 Trento, Italy

Mazzoleni, C
论文数: 0 引用数: 0
h-index: 0
机构: Univ Trent, INFM, I-38050 Trento, Italy

Franzò, G
论文数: 0 引用数: 0
h-index: 0
机构: Univ Trent, INFM, I-38050 Trento, Italy

Priolo, F
论文数: 0 引用数: 0
h-index: 0
机构: Univ Trent, INFM, I-38050 Trento, Italy
[8]
VISIBLE ELECTROLUMINESCENCE FROM SEMITRANSPARENT AU FILM EXTRA THIN SI-RICH SILICON-OXIDE FILM P-SI STRUCTURE
[J].
QIN, GG
;
LI, AP
;
ZHANG, BR
;
LI, BC
.
JOURNAL OF APPLIED PHYSICS,
1995, 78 (03)
:2006-2009

QIN, GG
论文数: 0 引用数: 0
h-index: 0
机构: ACAD SINICA,INT CTR MAT PHYS,SHENYANG 110015,PEOPLES R CHINA

LI, AP
论文数: 0 引用数: 0
h-index: 0
机构: ACAD SINICA,INT CTR MAT PHYS,SHENYANG 110015,PEOPLES R CHINA

ZHANG, BR
论文数: 0 引用数: 0
h-index: 0
机构: ACAD SINICA,INT CTR MAT PHYS,SHENYANG 110015,PEOPLES R CHINA

LI, BC
论文数: 0 引用数: 0
h-index: 0
机构: ACAD SINICA,INT CTR MAT PHYS,SHENYANG 110015,PEOPLES R CHINA
[9]
Electroluminescence microscopy and spectroscopy of silicon nanocrystals in thin SiO2 layers
[J].
Valenta, J
;
Lalic, N
;
Linnros, J
.
OPTICAL MATERIALS,
2001, 17 (1-2)
:45-50

Valenta, J
论文数: 0 引用数: 0
h-index: 0
机构: Royal Inst Technol, Dept Elect, S-16440 Kista, Sweden

Lalic, N
论文数: 0 引用数: 0
h-index: 0
机构: Royal Inst Technol, Dept Elect, S-16440 Kista, Sweden

Linnros, J
论文数: 0 引用数: 0
h-index: 0
机构: Royal Inst Technol, Dept Elect, S-16440 Kista, Sweden