HABIST: Histogram-based analog built in self test

被引：32

作者：

Frisch, A ^{[1
]}

Almy, T ^{[1
]}

机构：

[1] Tektronix Inc, Beaverton, OR 97077 USA

来源：

ITC - INTERNATIONAL TEST CONFERENCE 1997, PROCEEDINGS: INTEGRATING MILITARY AND COMMERCIAL COMMUNICATIONS FOR THE NEXT CENTURY | 1997年

关键词：

D O I：

10.1109/TEST.1997.639689

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

This histogram based method of test collects a statistical representation of the activity at a node and processes that representation using a template histogram as a reference. In most cases, no special stimulus is required - data is collected in-situ, while the circuit under test is functioning. (Alternatively, analog stimulus, e.g. using a pseudo random sequence generator or stored digital vectors with a D to A converter, may be provided). The results of processing the data against the template histogram is a compressed human readable signature that defines gain, offset, noise, and distortion errors. These errors can then be used heuristically to determine causation. This paper describes the HABIST method and optional variations in its implementation, algorithms for processing histograms to obtain signatures and other compressed forms of data, including waveform parameters, examples of the difference histograms that result from applying the algorithm, and methods and circuits for histogram generation.

引用

页码：760 / 767

页数：8