High-resolution transmission electron microscopy study of discontinuously precipitated Ni3Sn

被引:12
作者
Carvalho, PA [1 ]
Sijbolts, M [1 ]
Kooi, BJ [1 ]
De Hosson, JTM [1 ]
机构
[1] Univ Groningen, Netherlands Inst Met Res, Ctr Mat Sci, Dept Appl Phys, NL-9747 AG Groningen, Netherlands
关键词
transmission electron microscopy (TEM); interface; phase transformations; lattice defects; Ni alloys;
D O I
10.1016/S1359-6454(00)00275-5
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Under appropriate aging treatments Ni-Sn supersaturated solutions (alpha') decompose at an advancing reaction front into alternating lamellae of Sn-depleted face-centered cubic (fcc) alpha and DO19 Ni3Sn. This precipitation and the typical defect structures generated within the DO19 compound were investigated by using conventional and high-resolution transmission electron microscopy (CTEM and HRTEM). Complete characterization of defects lying on the basal planes of Ni3Sn lamellae was achieved by HRTEM imaging and iterative digital image matching. The spatial arrangement of stacking faults, rotation interfaces and antiphase boundaries revealed important aspects of the defect formation mechanisms. (C) 2000 Acta Metallurgica Inc. Published by Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:4203 / 4215
页数:13
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