A Practical Microvolt Josephson Voltage Standard for Nanovoltmeter Measurement Based on Dual-Channel Josephson Junction Array

被引：2

作者：

Li, Honghui ^{[1
,2
]}

Wang, Zengmin ^{[1
,2
]}

Cao, Wenhui ^{[1
,2
]}

Li, Jinjin ^{[1
,2
]}

He, Qing ^{[1
,2
]}

Li, Zhengkun ^{[1
,2
]}

机构：

[1] Natl Inst Metrol, Beijing, Peoples R China

[2] AQSIQ, Key Lab Elect Quantum Stand, Beijing, Peoples R China

来源：

2020 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS (CPEM) | 2020年

基金：

中国国家自然科学基金;

关键词：

Josephson effect; linearity; microvolt; measurement; quantum voltage; uncertainty; voltmeter;

D O I：

10.1109/cpem49742.2020.9191899

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper describes the application of a microvolt Josephson voltage standard based on a dual-channel Josephson junction array developed at NIM. Using the microvolt Josephson voltage standard, DC voltage measurements ranging from 1 mu V to 20 mu V have been realized. And two different types of nanovoltmeters have been calibrated for non-linearity on 6 mu V and 20 mu V ranges. Results have demonstrated that the latest developed microvolt Josephson voltage standard is practical and can meet the requirement of low-level DC measurements.

引用

页数：2

共 7 条

[1] Application of Josephson series arrays to a DC quantum voltmeter
Behr, R
Grimm, L
Funck, T
Kohlmann, J
Schulze, H
Müller, F
Schumacher, B
Warnecke, P
Niemeyer, J
[J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2001, 50 (02) : 185 - 187
[2] Application of the Josephson effect to voltage metrology
Benz, SP
Hamilton, CA
[J]. PROCEEDINGS OF THE IEEE, 2004, 92 (10) : 1617 - 1629
[3] Study of Nb/NbxSi1-x/Nb Josephson junction arrays
Cao Wen-Hui
Li Jin-Jin
Zhong Yuan
He Qing
[J]. CHINESE PHYSICS B, 2015, 24 (12)
[4] Developing Josephson junction array chips for microvolt applications
Cao, Wenhui
Li, Jinjin
Zhong, Yuan
Gao, Yuan
Li, Honghui
Wang, Zengmin
He, Qing
[J]. CHINESE PHYSICS B, 2016, 25 (05)
[5] Honghui Li, 2014, 29th Conference on Precision Electromagnetic Measurements (CPEM 2014), P744, DOI 10.1109/CPEM.2014.6898600
[6] Li H. H., 2016, CPEM 2016 C DIGEST, P114
[7] Li Honghui, 2019, 24 IMEKO TC4 INT S

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