Chemical sensing materials characterization by Kelvin probe technique

被引：26
作者：
D'Amico, A
Di Natale, C
Paolesse, R
Mantini, A
Goletti, C
Davide, F
Filosofi, G
机构：
[1] Univ Roma Tor Vergata, Dept Elect Engn, I-00133 Rome, Italy
[2] Univ Roma Tor Vergata, Dept Chem Sci & Technol, I-00133 Rome, Italy
[3] Univ Roma Tor Vergata, Dept Phys, I-00133 Rome, Italy
[4] INFM, I-00133 Rome, Italy
[5] Telecom Italia SPA, I-00144 Rome, Italy
来源：
SENSORS AND ACTUATORS B-CHEMICAL | 2000年 / 70卷 / 1-3期
关键词：
chemical sensing materials; Kelvin probe technique; input circuit; self-assembled monolayers; analytes; Langmuir-Blodgett films;
D O I：
10.1016/S0925-4005(00)00577-3
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
This paper deals first of all with an improvement of the Kelvin probe (KP) theory taking into consideration the series resistance of the input circuit. Then it illustrates a number of work function measurements performed on self-assembled monolayers interacting with varieties of analytes, and on Langmuir-Blodgett (LB) films of porphyrins of different thickness. The output intensities of the work function have been investigated and comments are given of the results obtained. The link between the work function and thickness of material under test has been analyzed and discussed as a method for the coverage factor estimation of absorbing surfaces. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：254 / 262
页数：9
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