Position and out-of-straightness measurement of a precision linear air-bearing stage by using a two-degree-of-freedom linear encoder

被引:43
作者
Kimura, Akihide [1 ]
Gao, Wei [1 ]
Zeng Lijiang [2 ]
机构
[1] Tohoku Univ, Dept Nanomech, Sendai, Miyagi 9808579, Japan
[2] Tsinghua Univ, Dept Precis Instruments, Beijing 100084, Peoples R China
关键词
measurement; linear encoder; linear air-bearing stage; position; out-of-straightness;
D O I
10.1088/0957-0233/21/5/054005
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This paper presents measurement of the X-directional position and the Z-directional out-of-straightness of a precision linear air-bearing stage with a two-degree-of-freedom (two-DOF) linear encoder, which is an optical displacement sensor for simultaneous measurement of the two-DOF displacements. The two-DOF linear encoder is composed of a reflective-type one-axis scale grating and an optical sensor head. A reference grating is placed perpendicular to the scale grating in the optical sensor head. Two-DOF displacements can be obtained from interference signals generated by the +/- 1 order diffracted beams from two gratings. A prototype two-DOF linear encoder employing the scale grating with the grating period of approximately 1.67 mu m measured the X-directional position and the Z-directional out-of-straightness of the linear air-bearing stage.
引用
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页数:10
相关论文
共 20 条
  • [1] [Anonymous], KGM SER CAT
  • [2] [Anonymous], NAN CAT
  • [3] Brigham E. O., 1988, The fast Fourier transform and its applications
  • [4] ABBE PRINCIPLE REVISITED - UPDATED INTERPRETATION
    BRYAN, JB
    [J]. PRECISION ENGINEERING-JOURNAL OF THE AMERICAN SOCIETY FOR PRECISION ENGINEERING, 1979, 1 (03): : 129 - 132
  • [5] *CAN INC, MICR ENC CAT
  • [6] Gao W., 2006, International Journal of Manufacturing Research, V1, P267, DOI 10.1504/IJMR.2006.011958
  • [7] Measurement of multi-degree-of-freedom error motions of a precision linear air-bearing stage
    Gao, W
    Arai, Y
    Shibuya, A
    Kiyono, S
    Park, CH
    [J]. PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY, 2006, 30 (01): : 96 - 103
  • [8] Scanning multi-probe straightness measurement system for alignment of linear collider accelerator
    Gao, W
    Yokoyama, J
    Kiyono, S
    Hitomi, N
    [J]. MEASUREMENT TECHNOLOGY AND INTELLIGENT INSTRUMENTS VI, 2005, 295-296 : 253 - 258
  • [9] *HEID GMBH, LIN ENC CAT
  • [10] Dimensional metrology for nanometre-scale science and engineering: towards sub-nanometre accurate encoders
    Heilmann, RK
    Chen, CG
    Konkola, PT
    Schattenburg, ML
    [J]. NANOTECHNOLOGY, 2004, 15 (10) : S504 - S511