Influence of sample surface height for evaluation of peak extraction algorithms in confocal microscopy

被引:47
作者
Chen, Cheng [1 ]
Wang, Jian [1 ]
Liu, Xiaojun [1 ]
Lu, Wenlong [1 ]
Zhu, Hong [1 ]
Jiang, Xiangqian [1 ,2 ]
机构
[1] Huazhong Univ Sci & Technol, Sch Mech Sci & Engn, State Key Lab Digital Mfg Equipment & Technol, Wuhan 430074, Hubei, Peoples R China
[2] Univ Huddersfield, EPSRC Ctr Innovat Mfg Adv Metrol, Huddersfield HD1 3DH, W Yorkshire, England
基金
中国国家自然科学基金;
关键词
WAVE-FRONT SENSOR; RADIUS MEASUREMENT; SIGNAL EVALUATION; IMAGING-SYSTEMS; METROLOGY; UNCERTAINTY; ABERRATIONS; DETECTOR; SIZE;
D O I
10.1364/AO.57.006516
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The axial resolution of confocal microscopy is not only dependent on optical characteristics but also on the utilized peak extraction algorithms. In previous evaluations of peak extraction algorithms, sample surface height is generally assumed to be zero, and only sampling-noise-induced peak extraction uncertainty was analyzed. Here we propose a sample surface-height-dependent (SHD) evaluation model that takes the combined considerations of sample surface height and noise for comparisons of algorithms' performances. Monte Carlo simulations were first conducted on the centroid algorithm and several nonlinear fitting algorithms such as the parabola fitting algorithm, Gaussian fitting algorithm, and sinc(2) fitting algorithm. Subsequently, the evaluation indicators, including mean peak extraction error and mean uncertainty were suggested for the algorithms' performance ranking. Finally, experimental verifications of the SHD model were carried out using a fiber-based chromatic confocal system. From our simulations and experiments, we demonstrate that sample surface height is a critical influencing factor in peak extraction computation in terms of both the accuracy and standard deviations. Compared to the conventional standard uncertainty evaluation model, our SHD model can provide a more comprehensive characterization of peak extraction algorithms' performance and offer a more flexible and consistent reference for algorithm selection. (C) 2018 Optical Society of America
引用
收藏
页码:6516 / 6526
页数:11
相关论文
共 30 条
[1]  
[Anonymous], 1012008 JCGM BIPM IU
[2]   Fast, bias-free algorithm for tracking single particles with variable size and shape [J].
Berglund, Andrew J. ;
McMahon, Matthew D. ;
McClelland, Jabez J. ;
Liddle, J. Alexander .
OPTICS EXPRESS, 2008, 16 (18) :14064-14075
[3]   CONFOCAL SURFACE PROFILING UTILIZING CHROMATIC ABERRATION [J].
BROWNE, MA ;
AKINYEMI, O ;
BOYDE, A .
SCANNING, 1992, 14 (03) :145-153
[4]   Spectral characteristics of chromatic confocal imaging systems [J].
Hillenbrand, Matthias ;
Mitschunas, Beate ;
Brill, Florian ;
Grewe, Adrian ;
Sinzinger, Stefan .
APPLIED OPTICS, 2014, 53 (32) :7634-7642
[5]   Minimum variance unbiased subpixel centroid estimation of point image limited by photon shot noise [J].
Jia, Hui ;
Yang, Jiankun ;
Li, Xiujian .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 2010, 27 (09) :2038-2045
[6]   Accuracy analysis of centroid calculated by a modified center detection algorithm for Shack-Hartmann wavefront sensor [J].
Li, Huaqlang ;
Song, Helun ;
Rao, Changhui ;
Rao, Xuejun .
OPTICS COMMUNICATIONS, 2008, 281 (04) :750-755
[7]   Laser multi-reflection differential confocal long focal-length measurement [J].
Li, Zhigang ;
Qiu, Lirong ;
Zhao, Weiqian ;
Zhao, Qi .
APPLIED OPTICS, 2016, 55 (18) :4910-4916
[8]   Monte Carlo based analysis of confocal peak extraction uncertainty [J].
Liu, Chenguang ;
Liu, Yan ;
Zheng, Tingting ;
Tan, Jiubin ;
Liu, Jian .
MEASUREMENT SCIENCE AND TECHNOLOGY, 2017, 28 (10)
[9]   Digital differential confocal microscopy based on spatial shift transformation [J].
Liu, J. ;
Wang, Y. ;
Liu, C. ;
Wilson, T. ;
Wang, H. ;
Tan, J. .
JOURNAL OF MICROSCOPY, 2014, 256 (02) :126-132
[10]  
LIU J, 2016, MEAS SCI TECHNOL, V27