An improved scheme and numerical simulation of segmented planar imaging detector for electro-optical reconnaissance

Segmented planar photoelectric detection imaging technology is a cutting-edge photoelectric imaging technology developed to realize the miniaturization and weight reduction of imaging systems. The imaging process of the integrated optical interferometry system was simulated by a computer simulation algorithm, and the influence of the system's structural parameters on the imaging results was explored. Moreover, an optimal scheme of the baseline matching method was proposed. The simulation results showed that increasing the number of interferometer arms and baselines can improve the imaging quality of the system. The proposed baseline matching optimization method could improve the low-frequency sampling rate of the system and thus, improve the imaging quality. In addition, simulation results also gave the optimal imaging distance of the system, which indicates that the system is most suitable for remote sensing imaging, meanwhile measuring the system's tolerance limit to phase noise. The requirements for the precision of waveguide fabrication are given, which play a guiding role in system manufacturing.