Images of interlayer Josephson vortices in Tl2Ba2CuO6+δ

被引:140
|
作者
Moler, KA [1 ]
Kirtley, JR
Hinks, DG
Li, TW
Xu, M
机构
[1] Princeton Univ, Dept Phys, Princeton, NJ 08544 USA
[2] IBM Corp, Thomas J Watson Res Ctr, Yorktown Heights, NY 10598 USA
[3] Argonne Natl Lab, Div Mat Sci, Argonne, IL 60439 USA
[4] Univ Chicago, James Franck Inst, Chicago, IL 60637 USA
关键词
D O I
10.1126/science.279.5354.1193
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
The strength of the interlayer Josephson tunneling in layered superconductors is an essential test of the interlayer tunneling model as a mechanism for superconductivity, as well as a useful phenomenological parameter. A scanning superconducting quantum interference device (SQUID) microscope was used to image interlayer Josephson vortices in Tl2Ba2CuO6+delta and to obtain a direct measure of the interlayer tunneling in a high-transition temperature superconductor with a single copper oxide plane per unit cell. The measured interlayer penetration depth, lambda(c), is similar to 20 micrometers, about 20 times the penetration depth required by the interlayer tunneling model.
引用
收藏
页码:1193 / 1196
页数:4
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