Near-field electron energy loss spectroscopy of nanoparticles

被引：51
作者：
Cohen, H [1 ]
Maniv, T
Tenne, R
Hacohen, YR
Stephan, O
Colliex, C
机构：
[1] Weizmann Inst Sci, IL-76100 Rehovot, Israel
[2] Technion Israel Inst Technol, Dept Chem, IL-32000 Haifa, Israel
[3] Univ Paris 11, F-91405 Orsay, France
来源：
PHYSICAL REVIEW LETTERS | 1998年 / 80卷 / 04期
关键词：
D O I：
10.1103/PhysRevLett.80.782
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
Near-field spectroscopy of nanoparticles was performed with a subnanometer probe size, using a scanning transmission electron microscope. at nonintersecting beam-particle configuration, surface collective modes are isolated from the entire excitation spectrum. The relativistic narrow beam generates a new type of spatial dispersion and may induce an additional spectral quantization. Line intensity variations during the mapping can be accounted for quantitatively by using a relatively simple theoretical model. This method is also suggested as a new way for transmission electron microscopy studies of beam sensitive samples.
引用
收藏
页码：782 / 785
页数：4
相关论文
共 16 条
  • [1] THEORETICAL AND EXPERIMENTAL-STUDY OF PLASMON EXCITATIONS IN SMALL METALLIC SPHERES
    ACHECHE, M
    COLLIEX, C
    KOHL, H
    NOURTIER, A
    TREBBIA, P
    [J]. ULTRAMICROSCOPY, 1986, 20 (1-2) : 99 - 105
  • [2] GROWTH OF MANGANESE FILLED CARBON NANOFIBERS IN THE VAPOR-PHASE
    AJAYAN, PM
    COLLIEX, C
    LAMBERT, JM
    BERNIER, P
    BARBEDETTE, L
    TENCE, M
    STEPHAN, O
    [J]. PHYSICAL REVIEW LETTERS, 1994, 72 (11) : 1722 - 1725
  • [3] SURFACE-PLASMON SCATTERING ON FLAT SURFACES AT GRAZING-INCIDENCE
    BATSON, PE
    [J]. ULTRAMICROSCOPY, 1983, 11 (04) : 299 - 302
  • [4] SIMULTANEOUS STEM IMAGING AND ELECTRON-ENERGY-LOSS SPECTROSCOPY WITH ATOMIC-COLUMN SENSITIVITY
    BATSON, PE
    [J]. NATURE, 1993, 366 (6457) : 727 - 728
  • [5] ANALYTICAL ELECTRON-MICROSCOPY AT THE ATOMIC LEVEL WITH PARALLEL ELECTRON-ENERGY LOSS SPECTROSCOPY
    BOUCHET, D
    COLLIEX, C
    FLORA, P
    KRIVANEK, O
    MORY, C
    TENCE, M
    [J]. MICROSCOPY MICROANALYSIS MICROSTRUCTURES, 1990, 1 (5-6): : 443 - 454
  • [6] ELECTRONIC EXCITATIONS IN SNS2 - AN ELECTRON-ENERGY-LOSS-SPECTROSCOPY STUDY
    COHEN, H
    FOLMAN, M
    MANIV, T
    BRENER, R
    LIFSHITZ, E
    ESTERLIT, Z
    [J]. PHYSICAL REVIEW B, 1992, 46 (08): : 4446 - 4455
  • [7] Egerton R.F, 1986, EELS in the Electron Microscope
  • [8] HIGH-RATE, GAS-PHASE GROWTH OF MOS2 NESTED INORGANIC FULLERENES AND NANOTUBES
    FELDMAN, Y
    WASSERMAN, E
    SROLOVITZ, DJ
    TENNE, R
    [J]. SCIENCE, 1995, 267 (5195) : 222 - 225
  • [9] FINK J, 1989, ADV ELECTRON EL PHYS, V75, P121
  • [10] RETARDATION EFFECTS IN THE INTERACTION OF CHARGED-PARTICLE BEAMS WITH BOUNDED CONDENSED MEDIA
    GARCIAMOLINA, R
    GRASMARTI, A
    HOWIE, A
    RITCHIE, RH
    [J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1985, 18 (27): : 5335 - 5345
12