Double crystal X-ray diffraction study of MBE self-organized InAs quantum dots

被引:0
作者
Wang, YT [1 ]
Zhuang, Y
Ma, WQ
Wang, W
Yang, XP
Chen, ZG
Jiang, DS
Zheng, HZ
机构
[1] Chinese Acad Sci, Inst Semicond, Natl Res Ctr Optoelect Technol, Beijing 100083, Peoples R China
[2] Chinese Acad Sci, Inst Semicond, Beijing Lab Superlattice & Microstruct, Beijing 100083, Peoples R China
来源
SCIENCE IN CHINA SERIES A-MATHEMATICS PHYSICS ASTRONOMY | 1998年 / 41卷 / 02期
关键词
quantum dots; X-ray diffraction; dynamic theory;
D O I
10.1007/BF02897442
中图分类号
O29 [应用数学];
学科分类号
070104 ;
摘要
A series of GaAs/InAs/GaAs samples were studied by double crystal X-ray diffraction and the X-ray dynamic theory was used to analyze the X-ray diffraction results. As the thickness of InAs layer exceeds 1.7 monolayer, 3-dimensional InAs islands appear. Pendellosung fringes shifted. A multilayer structure model is proposed to describe the strain status in the InAs islands of the sample and a good agreement is obtained between the experimental and theoretical curves.
引用
收藏
页码:172 / 176
页数:5
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